Beam-broadening effects in STEM/EDS measurement of radiation-induced segregation in high-purity 304L stainless steel

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Description

Radiation-induced segregation (RIS) is the spatial redistribution of elements at defect sinks such as grain boundaries and free surfaces during irradiation. This phenomenon has been studied in a wide variety of alloys and has been linked to irradiation-assisted stress corrosion cracking (IASCC) of nuclear reactor core components. Therefore, accurate determination of the grain boundary composition is important in understanding its effects on environmental cracking. Radiation-induced segregation profiles are routinely measured by scanning-transmission electron microscopy using energy-dispersive X-ray spectroscopy (STEM-EDS) and Auger electron spectroscopy (AES). Because of the narrow width of the segregation profile (typically less than 10-nm full width at ... continued below

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4 p.

Creation Information

Busby, J. T.; Was, G. S.; Allen, T. R.; Kenik, E. A. & Zaluzec, N. J. October 1997.

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  • Busby, J. T.
  • Was, G. S. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences
  • Allen, T. R. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences
  • Kenik, E. A. Oak Ridge National Lab., TN (United States). Metals and Ceramics Div.
  • Zaluzec, N. J. Argonne National Lab., IL (United States). Metals and Ceramics Div.

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Description

Radiation-induced segregation (RIS) is the spatial redistribution of elements at defect sinks such as grain boundaries and free surfaces during irradiation. This phenomenon has been studied in a wide variety of alloys and has been linked to irradiation-assisted stress corrosion cracking (IASCC) of nuclear reactor core components. Therefore, accurate determination of the grain boundary composition is important in understanding its effects on environmental cracking. Radiation-induced segregation profiles are routinely measured by scanning-transmission electron microscopy using energy-dispersive X-ray spectroscopy (STEM-EDS) and Auger electron spectroscopy (AES). Because of the narrow width of the segregation profile (typically less than 10-nm full width at half-maximum), the accuracy of grain boundary concentration measurements using STEM/EDS depends on the characteristics of the analyzing instrument, specifically, the excited volume in which x-rays are generated. This excited volume is determined by both electron beam diameter and the primary electron beam energy. Increasing the primary beam energy in STEM/EDS produces greater measured grain boundary segregation, as the reduced electron beam broadening a smaller excited volume. In this work, the effect of beam broadening is assessed on segregation measurements in a 304L stainless steel sample irradiated with 3.2 MeV protons at 400 C to doses of 3.0 and 0.1 dpa. The STEM/EDS measurements are also compared to measurements made using AES.

Physical Description

4 p.

Notes

INIS; OSTI as DE98050441

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  • Microscopy and Microanalysis `97, Cleveland, OH (United States), 10-14 Aug 1997

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  • Other: DE98050441
  • Report No.: ANL/MSD/CP--94776
  • Report No.: CONF-970834--
  • Grant Number: W-31109-ENG-38;FG02-93ER12130;AC05-96OR22464;AC05-76OR00033
  • DOI: 10.2172/554847 | External Link
  • Office of Scientific & Technical Information Report Number: 554847
  • Archival Resource Key: ark:/67531/metadc691533

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  • October 1997

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  • Aug. 14, 2015, 8:43 a.m.

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  • Dec. 16, 2015, 10:58 a.m.

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Busby, J. T.; Was, G. S.; Allen, T. R.; Kenik, E. A. & Zaluzec, N. J. Beam-broadening effects in STEM/EDS measurement of radiation-induced segregation in high-purity 304L stainless steel, report, October 1997; Illinois. (digital.library.unt.edu/ark:/67531/metadc691533/: accessed August 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.