The role of implantation damage in the production of silicon-on-insulator films by co-Implantation of He{sup +} and H{sup +}

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Recent work has demonstrated that the process of silicon thin film separation by hydrogen implantation, as well as the more basic phenomenon of surface blistering, can occur at a much lower total dose when H and He are co-implanted than when H is implanted alone. Building on that work, this paper investigates the role of implantation damage in this process by separating the contributions of gas pressure from those of damage. Three different experiments using co-implantation were designed. In the first of these experiments, H and He implants were spatially separated thereby separating the damage from each implant. The second ... continued below

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13 p.

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Venezia, V.C.; Agarwal, A.; Haynes, T.E.; Holland, O.W.; Eaglesham, D.J.; Weldon, M.K. et al. January 1, 1998.

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Description

Recent work has demonstrated that the process of silicon thin film separation by hydrogen implantation, as well as the more basic phenomenon of surface blistering, can occur at a much lower total dose when H and He are co-implanted than when H is implanted alone. Building on that work, this paper investigates the role of implantation damage in this process by separating the contributions of gas pressure from those of damage. Three different experiments using co-implantation were designed. In the first of these experiments, H and He implants were spatially separated thereby separating the damage from each implant. The second experiment involved co-implantation of H and He at a temperature of 77 K to retain a larger amount of damage for the same gas dose. In the third experiment, Li was co-implanted with H, to create additional damage without introducing additional gas. These experiments together show that increasing the implantation damage itself hampers the formation of surface blisters, and that the increased efficiency observed for He co-implantation with H is due to the supplementary source of gas provided by the He.

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13 p.

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INIS; OSTI as DE98004113

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  • 8. international symposium on silicon materials science and technology, San Diego, CA (United States), 3-8 May 1998

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  • Other: DE98004113
  • Report No.: ORNL/CP--96086
  • Report No.: CONF-980528--
  • Grant Number: AC05-96OR22464
  • DOI: 10.2172/645531 | External Link
  • Office of Scientific & Technical Information Report Number: 645531
  • Archival Resource Key: ark:/67531/metadc690962

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  • January 1, 1998

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  • Aug. 14, 2015, 8:43 a.m.

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  • Jan. 21, 2016, 12:03 p.m.

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Venezia, V.C.; Agarwal, A.; Haynes, T.E.; Holland, O.W.; Eaglesham, D.J.; Weldon, M.K. et al. The role of implantation damage in the production of silicon-on-insulator films by co-Implantation of He{sup +} and H{sup +}, report, January 1, 1998; Tennessee. (digital.library.unt.edu/ark:/67531/metadc690962/: accessed December 13, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.