The uses of electron beam ion traps in the study of highly charged ions

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The Electron Beam Ion Trap (EBIT) is a relatively new tool for the study of highly charged ions. Its development has led to a variety of new experimental opportunities; measurements have been performed with EBITs using techniques impossible with conventional ion sources or storage rings. In this paper, I will highlight the various experimental techniques we have developed and the results we have obtained using the EBIT and higher-energy Super-EBIT built at the Lawrence Livermore National Laboratory. The EBIT employs a high-current-density electron beam to trap, ionize, and excite a population of ions. The ions can be studied in situ ... continued below

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25 p.

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Knapp, D. November 2, 1994.

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Description

The Electron Beam Ion Trap (EBIT) is a relatively new tool for the study of highly charged ions. Its development has led to a variety of new experimental opportunities; measurements have been performed with EBITs using techniques impossible with conventional ion sources or storage rings. In this paper, I will highlight the various experimental techniques we have developed and the results we have obtained using the EBIT and higher-energy Super-EBIT built at the Lawrence Livermore National Laboratory. The EBIT employs a high-current-density electron beam to trap, ionize, and excite a population of ions. The ions can be studied in situ or extracted from the trap for external experiments. The trapped ions form an ionization-state equilibrium determined by the relative ionization and recombination rates. Ions of several different elements may simultaneously be present in the trap. The ions are nearly at rest, and, for most systems, all in their ground-state configurations. The electron-ion interaction energy has a narrow distribution and can be varied over a wide range. We have used the EBIT devices for the measurement of electron-ion interactions, ion structure, ion-surface interactions, and the behavior of low-density plasmas.

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25 p.

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OSTI as DE95011537

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  • NATO Advanced Study Institute: physics with multiply charged ions, Cargese (France), 18 Jul - 13 Aug 1994

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  • Other: DE95011537
  • Report No.: UCRL-JC--119193
  • Report No.: CONF-9407166--2
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 64192
  • Archival Resource Key: ark:/67531/metadc690420

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  • November 2, 1994

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  • Aug. 14, 2015, 8:43 a.m.

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  • Feb. 23, 2016, 12:51 p.m.

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Knapp, D. The uses of electron beam ion traps in the study of highly charged ions, article, November 2, 1994; California. (digital.library.unt.edu/ark:/67531/metadc690420/: accessed June 25, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.