Stabilization of electron beam spot size by self bias potential

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Description

In high resolution flash x-ray imaging technology the electric field developed between the electron beam and the converter target is large enough to draw ions from the target surface. The ions provide fractional neutralization and cause the electron beam to focus radially inward, and the focal point subsequently moves upstream due to the expansion of the ion column. A self-bias target concept is proposed and verified via computer simulation that the electron charge deposited on the target can generate an electric potential, which can effectively limit the ion motion and thereby stabilize the growth of the spot size. A target ... continued below

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4 p.

Creation Information

Kwan, T.J.T.; Moir, D.C.; Snell, C.M. & Kang, M. December 31, 1998.

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Description

In high resolution flash x-ray imaging technology the electric field developed between the electron beam and the converter target is large enough to draw ions from the target surface. The ions provide fractional neutralization and cause the electron beam to focus radially inward, and the focal point subsequently moves upstream due to the expansion of the ion column. A self-bias target concept is proposed and verified via computer simulation that the electron charge deposited on the target can generate an electric potential, which can effectively limit the ion motion and thereby stabilize the growth of the spot size. A target chamber using the self bias target concept was designed and tested in the Integrated Test Stand (ITS). The authors have obtained good agreement between computer simulation and experiment.

Physical Description

4 p.

Notes

INIS; OSTI as DE99002756

Source

  • 19. international linac conference, Chicago, IL (United States), 23-28 Aug 1998

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  • Other: DE99002756
  • Report No.: LA-UR--98-3698
  • Report No.: CONF-980827--
  • Grant Number: W-7405-ENG-36
  • DOI: 10.2172/350977 | External Link
  • Office of Scientific & Technical Information Report Number: 350977
  • Archival Resource Key: ark:/67531/metadc688553

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • December 31, 1998

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

Description Last Updated

  • Feb. 26, 2016, 6:22 p.m.

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Kwan, T.J.T.; Moir, D.C.; Snell, C.M. & Kang, M. Stabilization of electron beam spot size by self bias potential, report, December 31, 1998; New Mexico. (digital.library.unt.edu/ark:/67531/metadc688553/: accessed December 17, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.