Materials analysis using positron beam lifetime spectroscopy

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We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is routinely used to perform positron lifetime analysis with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL high ... continued below

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126 Kilobytes

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Hartley, J.; Howell, R. H., Asoka-Kumar, P.; Sterne, P. & Stoeffl, W. November 12, 1998.

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Description

We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is routinely used to perform positron lifetime analysis with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL high current positron source. This beam will enable defect-specific, 3-dimensional maps of defect concentration with sub-micron location resolution. When coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification.

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126 Kilobytes

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  • International Workshop on Advanced Techniques of Positron Generation and Control at RIKEN, Wako, Japan, December 14-16, 1998

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  • Other: DE00003397
  • Report No.: UCRL-JC-132819
  • Grant Number: W-7405-Eng-48
  • Office of Scientific & Technical Information Report Number: 3397
  • Archival Resource Key: ark:/67531/metadc687722

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • November 12, 1998

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

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  • Feb. 24, 2016, 3:51 p.m.

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Hartley, J.; Howell, R. H., Asoka-Kumar, P.; Sterne, P. & Stoeffl, W. Materials analysis using positron beam lifetime spectroscopy, article, November 12, 1998; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc687722/: accessed December 11, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.