Fabrication and testing of optics for EUV projection lithography

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EUV Lithography (EUVL) is a leading candidate as a stepper technology for fabricating the ``0.1 {micro}m generation`` of microelectronic circuits. EUVL is an optical printing technique qualitatively similar to DUV Lithography (DUVL), except that 11-13nm wavelength light is used instead of 193-248nm. The feasibility of creating 0.1{micro}m features has been well-established using small-field EUVL printing tools and development efforts are currently underway to demonstrate that cost-effective production equipment can be engineered to perform full-width ring-field imaging consistent with high wafer throughput rates Ensuring that an industrial supplier base will be available for key components and subsystems is crucial to the ... continued below

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14 p.

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Taylor, J. S., LLNL March 18, 1998.

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Description

EUV Lithography (EUVL) is a leading candidate as a stepper technology for fabricating the ``0.1 {micro}m generation`` of microelectronic circuits. EUVL is an optical printing technique qualitatively similar to DUV Lithography (DUVL), except that 11-13nm wavelength light is used instead of 193-248nm. The feasibility of creating 0.1{micro}m features has been well-established using small-field EUVL printing tools and development efforts are currently underway to demonstrate that cost-effective production equipment can be engineered to perform full-width ring-field imaging consistent with high wafer throughput rates Ensuring that an industrial supplier base will be available for key components and subsystems is crucial to the success of EUVL. In particular, the projection optics are the heart of the EUVL imaging system, yet they have figure and finish specifications that are beyond the state-of-the-art in optics manufacturing. Thus it is important to demonstrate that industry will be able to fabricate and certify these optics commensurate with EUVL requirements. Indeed, the goal of this paper is to demonstrate that procuring EUVL projection optical substrates is feasible. This conclusion is based on measurements of both commercially-available and developmental substrates. The paper discusses EUVL figure and finish specifications, followed by examples of ultrasmooth and accurate surfaces, and concludes with a discussion of how substrates are measured and evaluated.

Physical Description

14 p.

Notes

OSTI as DE98058865

Other: FDE: PDF; PL:

Source

  • 23. SPIE annual international symposium on microlithography conference, Santa Clara, CA (United States), 22-27 Feb 1998

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  • Other: DE98058865
  • Report No.: UCRL-JC--128290-Rev.1
  • Report No.: CONF-980225--
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 305325
  • Archival Resource Key: ark:/67531/metadc686691

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  • March 18, 1998

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  • July 25, 2015, 2:20 a.m.

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  • April 10, 2017, 1:39 p.m.

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Taylor, J. S., LLNL. Fabrication and testing of optics for EUV projection lithography, article, March 18, 1998; California. (digital.library.unt.edu/ark:/67531/metadc686691/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.