EN-318 evaluation of slow warm-up through special test of MC-890 type power supplies

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Description

ESE-171: This EN run was made to determine if there is any relationship between the H-5 transistor electrical characteristics, the assembly processes, and slow warm-up of the MC-890 Power Supply. Included is the test data on the H-5 transistors and the results of the High Temperature Life Test (185 {degrees}F) of 380 MC-890 Power Supplies.

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78 p.

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Ling, R.F. September 1, 1960.

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This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by the UNT Libraries Government Documents Department to the UNT Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 79 times. More information about this report can be viewed below.

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ESE-171: This EN run was made to determine if there is any relationship between the H-5 transistor electrical characteristics, the assembly processes, and slow warm-up of the MC-890 Power Supply. Included is the test data on the H-5 transistors and the results of the High Temperature Life Test (185 {degrees}F) of 380 MC-890 Power Supplies.

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78 p.

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OSTI as DE97001046

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  • Other Information: PBD: Sep 1960

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  • September 1, 1960

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  • July 25, 2015, 2:20 a.m.

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  • Nov. 17, 2015, 8:09 p.m.

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Ling, R.F. EN-318 evaluation of slow warm-up through special test of MC-890 type power supplies, report, September 1, 1960; United States. (https://digital.library.unt.edu/ark:/67531/metadc686588/: accessed May 14, 2025), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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