In situ x-ray diffraction studies of a new LiMg{sub 0.125}Ni{sub 0.75}O{sub 2} cathode material

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A Synchrotron x-ray source was used for In Situ x-ray diffraction studies during charge on a new LiMg{sub 0.125}Ti{sub 0.125}Ni{sub 0.75} cathode material synthesized by FMC Corp. It had been demonstrated by Gao that this new material has superior thermal stability than LiNiO{sub 2} and LiCo{sub 0.2}Ni{sub 0.8}O{sub 2} at over-charged state. In this current paper, studies on the relationship between the structural changes and thermal stability at over-charged state for these materials are presented. For the first time, the thermal stability of these materials are related to their structural changes during charge, especially to the formation and lattice constant ... continued below

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15 pages

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Yang, X.Q.; Sun, X.; McBreen, J.; Gao, Y.; Yakovleva, M.V.; Xing, X.K. et al. July 1, 1999.

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A Synchrotron x-ray source was used for In Situ x-ray diffraction studies during charge on a new LiMg{sub 0.125}Ti{sub 0.125}Ni{sub 0.75} cathode material synthesized by FMC Corp. It had been demonstrated by Gao that this new material has superior thermal stability than LiNiO{sub 2} and LiCo{sub 0.2}Ni{sub 0.8}O{sub 2} at over-charged state. In this current paper, studies on the relationship between the structural changes and thermal stability at over-charged state for these materials are presented. For the first time, the thermal stability of these materials are related to their structural changes during charge, especially to the formation and lattice constant change of a hexagonal phase (H3). The spectral evidence support the hypothesis that the improvement of thermal stability is obtained by suppressing the formation of H3 phase and reducing the shrinkage of its lattice constant c when charged above 4.3 V.

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15 pages

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INIS; OSTI as DE00355000

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  • Other Information: Supercedes report DE99003360; PBD: [1999]

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  • Other: DE99003360
  • Report No.: BNL--66139
  • Report No.: CONF-990514--
  • Grant Number: AC02-98CH10886
  • DOI: 10.2172/355000 | External Link
  • Office of Scientific & Technical Information Report Number: 355000
  • Archival Resource Key: ark:/67531/metadc686274

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  • July 1, 1999

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  • July 25, 2015, 2:20 a.m.

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  • Nov. 9, 2015, 12:37 p.m.

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Yang, X.Q.; Sun, X.; McBreen, J.; Gao, Y.; Yakovleva, M.V.; Xing, X.K. et al. In situ x-ray diffraction studies of a new LiMg{sub 0.125}Ni{sub 0.75}O{sub 2} cathode material, report, July 1, 1999; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc686274/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.