Characterization of microstructure and crack propagation in alumina using orientation imaging microscopy (OIM)

PDF Version Also Available for Download.

Description

TEM, while capable of determining misorientation of adjacent grains, can practicably provide information only for a small number of grain boundaries. A more complete description of the structure of a polycrystal can be obtained using a new technique OIM, which uses crystallographic orientation data obtained from Backscattered Electron Kikuchi patterns (BEKP), collected using SEM. This paper describes general OIM results for 99.7 and 99.99% Al{sub 2}O{sub 3} samples with grain sizes 4-27 {mu}m. The results include image quality maps, grain boundary maps, pole figures, and lattice misorientations depicted on MacKenzie plots and in Rodrigues space. High quality BEKPs were obtained ... continued below

Physical Description

23 p.

Creation Information

Glass, S.J.; Michael, J.R.; Readey, M.J.; Wright, S.I. & Field, D.P. December 1, 1996.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Authors

Sponsor

Publisher

  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

TEM, while capable of determining misorientation of adjacent grains, can practicably provide information only for a small number of grain boundaries. A more complete description of the structure of a polycrystal can be obtained using a new technique OIM, which uses crystallographic orientation data obtained from Backscattered Electron Kikuchi patterns (BEKP), collected using SEM. This paper describes general OIM results for 99.7 and 99.99% Al{sub 2}O{sub 3} samples with grain sizes 4-27 {mu}m. The results include image quality maps, grain boundary maps, pole figures, and lattice misorientations depicted on MacKenzie plots and in Rodrigues space. High quality BEKPs were obtained from all specimens. Images and data readily reveal the grain morphology, texture, and grain boundary structure. Subtle differences in texture and grain boundary structure (crystallite lattice misorientations) are observed for the different alumina specimens. Distributions of misorientations for cracked boundaries in alumina are compared to the bulk distribution of boundaries and generally larger misorientations are observed.

Physical Description

23 p.

Notes

OSTI as DE97001443

Source

  • Ceramic microstructures 96, Berkeley, CA (United States), 24-27 Jun 1996

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE97001443
  • Report No.: SAND--96-1019C
  • Report No.: CONF-9606237--4
  • Grant Number: AC04-94AL85000
  • DOI: 10.2172/443200 | External Link
  • Office of Scientific & Technical Information Report Number: 419961
  • Archival Resource Key: ark:/67531/metadc685127

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • December 1, 1996

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

Description Last Updated

  • May 5, 2016, 8 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 4

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Glass, S.J.; Michael, J.R.; Readey, M.J.; Wright, S.I. & Field, D.P. Characterization of microstructure and crack propagation in alumina using orientation imaging microscopy (OIM), article, December 1, 1996; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc685127/: accessed April 27, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.