System level latchup mitigation for single event and transient radiation effects on electronics

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Description

A `blink` technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection means, power dump logic means, and energy limiting measures with autonomous recovery. The event detection means includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The current ... continued below

Physical Description

Medium: P; Size: 32 p.

Creation Information

Kimbrough, J.R. & Colella, N.J. December 31, 1994.

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Description

A `blink` technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection means, power dump logic means, and energy limiting measures with autonomous recovery. The event detection means includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The current sensing means is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation. The power dump means includes power dump logic means having a first input terminal connected to the output terminal of the ionizing radiation pulse detection means and having a second input terminal connected to the output terminal of the current sensing means. The power dump logic means provides an output signal to the input terminal of the means for opening the power bus and the means for shorting the power bus to a ground potential to remove power from the power bus. The energy limiting mean with autonomous recovery includes means for opening the power bus and means for shorting the power bus to a ground potential. The means for opening the power bus and means for shorting the power bus to a ground potential includes a series FET and a shunt FET. The invention provides for self-contained sensing for latchup, first removal of power to protect latched components, and autonomous recovery to enable transparent operation of other system elements.

Physical Description

Medium: P; Size: 32 p.

Notes

OSTI as DE97003566

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  • Other Information: PBD: 1994

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  • Other: DE97003566
  • Report No.: PATENTS-US--A8291086
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 450076
  • Archival Resource Key: ark:/67531/metadc685088

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • December 31, 1994

Added to The UNT Digital Library

  • July 25, 2015, 2:21 a.m.

Description Last Updated

  • Feb. 17, 2016, 6:41 p.m.

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Citations, Rights, Re-Use

Kimbrough, J.R. & Colella, N.J. System level latchup mitigation for single event and transient radiation effects on electronics, patent, December 31, 1994; California. (digital.library.unt.edu/ark:/67531/metadc685088/: accessed December 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.