Emission of secondary particles from metals and insulators at impact of slow highly charged ions

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Emission of secondary electrons and ions from clean Au, CxHy-Au, and SiO{sub 2} surfaces at impact of slow (v{approx}0.3 v{sub Bohr}) ions were measured as function of incident ion charge for 1+{le}q{le}75+. Electron yields from thermal SiO{sub 2} films (150 mm on Si) were found to be lower than those from the other two for q>3+. Yields of negative secondary ions from SiO{sub 2} and CxHy-Au were recorded in parallel with electron emission data and exhibit a q{sub 4} dependency on incident ion charge. Direct comparison of collisional and electronic contributions to secondary ion production from SiO{sub 2} films using ... continued below

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27 p.

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Schenkel, T. October 31, 1996.

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Emission of secondary electrons and ions from clean Au, CxHy-Au, and SiO{sub 2} surfaces at impact of slow (v{approx}0.3 v{sub Bohr}) ions were measured as function of incident ion charge for 1+{le}q{le}75+. Electron yields from thermal SiO{sub 2} films (150 mm on Si) were found to be lower than those from the other two for q>3+. Yields of negative secondary ions from SiO{sub 2} and CxHy-Au were recorded in parallel with electron emission data and exhibit a q{sub 4} dependency on incident ion charge. Direct comparison of collisional and electronic contributions to secondary ion production from SiO{sub 2} films using a beam of charge state equilibrated Xe (at 2.75 keV/u) shows positive and negative secondary ion yield increases with incident ion charge of >400. Results are discussed in relation to key signatures of electronic sputtering by Coulomb explosions.

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27 p.

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INIS; OSTI as DE97052569

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  • 11. international workshop on inelastic ion surface collisions, Wangerooge (Germany), 22-27 Sep 1996

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  • Other: DE97052569
  • Report No.: UCRL-JC--125769
  • Report No.: CONF-9609268--3
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 491838
  • Archival Resource Key: ark:/67531/metadc683748

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Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • October 31, 1996

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  • July 25, 2015, 2:21 a.m.

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  • Feb. 16, 2016, 6:45 p.m.

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Schenkel, T. Emission of secondary particles from metals and insulators at impact of slow highly charged ions, article, October 31, 1996; California. (digital.library.unt.edu/ark:/67531/metadc683748/: accessed April 25, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.