Design and performance of beam test electronics for the PHENIX Multiplicity Vertex Detector

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The system architecture and test results of the custom circuits and beam test system for the Multiplicity-Vertex Detector (MVD) for the PHENIX detector collaboration at the Relativistic Heavy Ion Collider (RHIC) are presented in this paper. The final detector per-channel signal processing chain will consist of a preamplifier-gain stage, a current-mode summed multiplicity discriminator, a 64-deep analog memory (simultaneous read-write), a post-memory analog correlator, and a 10-bit 5 {mu}s ADC. The Heap Manager provides all timing control, data buffering, and data formatting for a single 256-channel multi-chip module (MCM). Each chip set is partitioned into 32-channel sets. Beam test (16-cell ... continued below

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6 p.

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Britton, C.L. Jr.; Bryan, W.L. & Emery, M.S. December 31, 1996.

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Description

The system architecture and test results of the custom circuits and beam test system for the Multiplicity-Vertex Detector (MVD) for the PHENIX detector collaboration at the Relativistic Heavy Ion Collider (RHIC) are presented in this paper. The final detector per-channel signal processing chain will consist of a preamplifier-gain stage, a current-mode summed multiplicity discriminator, a 64-deep analog memory (simultaneous read-write), a post-memory analog correlator, and a 10-bit 5 {mu}s ADC. The Heap Manager provides all timing control, data buffering, and data formatting for a single 256-channel multi-chip module (MCM). Each chip set is partitioned into 32-channel sets. Beam test (16-cell deep memory) performance for the various blocks will be presented as well as the ionizing radiation damage performance of the 1.2 {mu} n-well CMOS process used for preamplifier fabrication.

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6 p.

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OSTI as DE97001374

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  • Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Anaheim, CA (United States), 2-9 Nov 1996

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  • Other: DE97001374
  • Report No.: CONF-961123--10
  • Grant Number: AC05-96OR22464
  • Office of Scientific & Technical Information Report Number: 437764
  • Archival Resource Key: ark:/67531/metadc682011

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  • December 31, 1996

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  • July 25, 2015, 2:20 a.m.

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  • Jan. 21, 2016, 7:45 p.m.

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Britton, C.L. Jr.; Bryan, W.L. & Emery, M.S. Design and performance of beam test electronics for the PHENIX Multiplicity Vertex Detector, article, December 31, 1996; Tennessee. (digital.library.unt.edu/ark:/67531/metadc682011/: accessed September 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.