X-ray tomographic microscopy for non-destructive inspection and advanced materials characterization. Final report, May 22, 1992--May 21, 1994 Page: 1 of 19
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X-ray Tomographic Microscopy for Non-Destructive
Inspection and Advanced Materials Characterization
Final Report
CRADA No. TC-0113-91
Date: 04/27/95 TACT: Revision: 1
A. Parties / LL-i o S
The project is a relationship between the Lawrence Livermore National Laboratory (LLNL) and
General Electric Aircraft Engines.
University of California
Lawrence Livermore National Laboratory
Attn. John Kinney
7000 East Avenue, L-356
Livermore, CA 94550
General Electric Aircraft Engines
Quality Technology Center
Attn. Mr. Ralph Isaacs
10270 Saint Rita Lane, Q-8
Cincinnati, Ohio 45215
B. Project Scope
This was a CRADA to transfer the x-ray tomographic microscope technology to the Quality
Technology Center of General Electric Air Craft Engines Division in Ohio. The x-ray tomographic
microscope (XTM) is a high resolution, three-dimensional imaging system that can be used to
materials microstructures noninvasively. The apparatus consists of an x-ray source, x-ray
collimators, sample positioning stages, a fluorescent screen to convert x-rays to visible light, an
optical lens, and a thermoelectrically cooled charge coupled device detector. The details of the
microscope's design have been described elsewhere. In practice, the sample to be imaged is
positioned on a rotating stage. The sample is initially translated out of the x-ray path, and an image
is obtained of the incident x-ray beam (the reference image). Next, the sample is placed between
the x-ray path and the scintillator, and another image, the projection image, is acquired. The ratios
of the logarithms of the reference image and the projection image provide values of the integrated
x-ray attenuation through the sample. By rotating the sample in discrete angular increments
through 180 degrees, enough data can be obtained to reconstruct the two-dimensional projection
images into a three-dimensional image of the mineral density distribution in the sample. This
reconstruction procedure, known as reconstruction from projections, is usually performed with the
technique of Fourier-filtered back-projection. Using the present microscope, a 1 cubic centimeter
volume can be imaged with five micrometer volume elements in about one hour or less.
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X-ray tomographic microscopy for non-destructive inspection and advanced materials characterization. Final report, May 22, 1992--May 21, 1994, report, April 27, 1995; California. (https://digital.library.unt.edu/ark:/67531/metadc681720/m1/1/: accessed April 24, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.