Proceedings of PIXEL98 -- International pixel detector workshop

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Experiments around the globe face new challenges of more precision in the face of higher interaction rates, greater track densities, and higher radiation doses, as they look for rarer and rarer processes, leading many to incorporate pixelated solid-state detectors into their plans. The highest-readout rate devices require new technologies for implementation. This workshop reviewed recent, significant progress in meeting these technical challenges. Participants presented many new results; many of them from the weeks--even days--just before the workshop. Brand new at this workshop were results on cryogenic operation of radiation-damaged silicon detectors (dubbed the Lazarus effect). Other new work included a ... continued below

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646 p.

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Anderson, D.F. & Kwan, S. August 1, 1998.

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Experiments around the globe face new challenges of more precision in the face of higher interaction rates, greater track densities, and higher radiation doses, as they look for rarer and rarer processes, leading many to incorporate pixelated solid-state detectors into their plans. The highest-readout rate devices require new technologies for implementation. This workshop reviewed recent, significant progress in meeting these technical challenges. Participants presented many new results; many of them from the weeks--even days--just before the workshop. Brand new at this workshop were results on cryogenic operation of radiation-damaged silicon detectors (dubbed the Lazarus effect). Other new work included a diamond sensor with 280-micron collection distance; new results on breakdown in p-type silicon detectors; testing of the latest versions of read-out chip and interconnection designs; and the radiation hardness of deep-submicron processes.

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646 p.

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INIS; OSTI as DE98058230

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  • PIXEL `98: international Pixel detector workshop, Batavia, IL (United States), 7-9 May 1998

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  • Other: DE98058230
  • Report No.: FNAL/C--98/196
  • Report No.: CONF-9805102--PROC.
  • Grant Number: AC02-76CH03000
  • Office of Scientific & Technical Information Report Number: 296731
  • Archival Resource Key: ark:/67531/metadc680978

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Office of Scientific & Technical Information Technical Reports

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  • August 1, 1998

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  • July 25, 2015, 2:20 a.m.

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  • April 1, 2016, 4:31 p.m.

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Anderson, D.F. & Kwan, S. Proceedings of PIXEL98 -- International pixel detector workshop, article, August 1, 1998; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc680978/: accessed November 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.