Several measurement systems and techniques for the electrical and thermal characterization of thermophotovoltaic (TPV) cells are discussed. One computer controlled system measures the quantum efficiency of cells from 0.8 to 2.6 microns. A probe resistor is used to account for cells with low shunt resistances. In the second system, a production-style robot provides automated measurements of I-V characteristics under dark, blackbody, and flashed illumination conditions. The system measures the length and width of each cell, and calculates the open circuit voltage, short circuit current, fill factor, and maximum power for each cell. The mean and standard deviation of the measured ...
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Knolls Atomic Power Lab., Schenectady, NY (United States)
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Schenectady, New York
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Several measurement systems and techniques for the electrical and thermal characterization of thermophotovoltaic (TPV) cells are discussed. One computer controlled system measures the quantum efficiency of cells from 0.8 to 2.6 microns. A probe resistor is used to account for cells with low shunt resistances. In the second system, a production-style robot provides automated measurements of I-V characteristics under dark, blackbody, and flashed illumination conditions. The system measures the length and width of each cell, and calculates the open circuit voltage, short circuit current, fill factor, and maximum power for each cell. The mean and standard deviation of the measured parameters are also computed. The third system measures the overall cell efficiency by a calorimetric technique. Heat losses due to radiation, conduction, and convection are factored into the analysis method.
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Danielson, L.R.; Parrington, J.R.; Charache, G.W.; Nichols, G.J. & Depoy, D.M.Measurement techniques for single junction thermophotovoltaic cells,
article,
October 1, 1998;
Schenectady, New York.
(digital.library.unt.edu/ark:/67531/metadc679645/:
accessed November 12, 2018),
University of North Texas Libraries, Digital Library, digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.
