Soft x-ray spectromicroscopy development for materials science at the Advanced Light Source

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Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on ... continued below

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29 p.

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Warwick, T.; Padmore, H.; Ade, H.; Hitchcock, A.P.; Rightor, E.G. & Tonner, B.P. August 1, 1996.

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Description

Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.

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29 p.

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INIS; OSTI as DE97001260

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  • 1. international synchrotron radiation satellite meeting, Argonne, IL (United States), 4-7 Aug 1996

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  • Other: DE97001260
  • Report No.: LBNL--38906
  • Report No.: CONF-960824--1
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 414417
  • Archival Resource Key: ark:/67531/metadc679605

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • August 1, 1996

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  • July 25, 2015, 2:20 a.m.

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  • April 5, 2016, 1:43 p.m.

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Warwick, T.; Padmore, H.; Ade, H.; Hitchcock, A.P.; Rightor, E.G. & Tonner, B.P. Soft x-ray spectromicroscopy development for materials science at the Advanced Light Source, article, August 1, 1996; California. (digital.library.unt.edu/ark:/67531/metadc679605/: accessed October 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.