Characterization inconsistencies in CdTe and CZT gamma-ray detectors

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In the past few years, significant developments in cadmium telluride (CdTe) and cadmium zinc telluride (CZT) semiconductor materials have taken place with respect to both quality and yield. Many of the more recent developments have occurred in the area of CZT crystal growth. This has resulted in an explosion of interest in the use of these materials in ambient temperature gamma-ray detectors. Most, if not all, of the manufacturers of CdTe and CZT have acquired government funding to continue research in development and applications, indicating the importance of these improvements in material quality. We have examined many detectors, along with ... continued below

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5 p.

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Lavietes, A.D. & McQuaid, J.H. October 1, 1994.

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Description

In the past few years, significant developments in cadmium telluride (CdTe) and cadmium zinc telluride (CZT) semiconductor materials have taken place with respect to both quality and yield. Many of the more recent developments have occurred in the area of CZT crystal growth. This has resulted in an explosion of interest in the use of these materials in ambient temperature gamma-ray detectors. Most, if not all, of the manufacturers of CdTe and CZT have acquired government funding to continue research in development and applications, indicating the importance of these improvements in material quality. We have examined many detectors, along with the accompanying manufacturer`s data, and it has become apparent that a clear standard does not exist by which each manufacturer characterizes the performance of their material. Result is a wide variety of performance claims that have no basis for comparison and normally cannot be readily reproduced. This paper first supports our observations and then proposes a standard that all manufacturers and users of these materials may use for characterization.

Physical Description

5 p.

Notes

INIS; OSTI as DE95009567

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  • Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Norfolk, VA (United States), 30 Oct - 5 Nov 1994

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  • Other: DE95009567
  • Report No.: UCRL-JC--117142
  • Report No.: CONF-941061--18
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 46455
  • Archival Resource Key: ark:/67531/metadc679486

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • October 1, 1994

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  • July 25, 2015, 2:21 a.m.

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  • Feb. 18, 2016, 11:51 a.m.

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Lavietes, A.D. & McQuaid, J.H. Characterization inconsistencies in CdTe and CZT gamma-ray detectors, article, October 1, 1994; California. (digital.library.unt.edu/ark:/67531/metadc679486/: accessed December 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.