Defect study in fused silica using near field scanning optical microscopy

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Surface defects in fused silica have been characterized using Near Field Scanning Optical Microscopy (NSOM). Using total internal reflection of a p- or s- polarized laser beam, optical scattering from defects located on the surface itself as well as in the subsurface layer of polished fused silica has been measured by NSOM. The local scattering intensity has been compared with simultaneously measured surface topography. In addition, surface defects intentionally created on a fused silica surface by nano-indentation have been used to establish a correlation between optical scattering of s- and p- polarized light, surface morphology and the well known subsurface ... continued below

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7 p.

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Yan, M.; Wang, L.; Siekhaus, W.; Kozlowski, M.; Yang, J. & Mohideen, U. January 21, 1998.

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Description

Surface defects in fused silica have been characterized using Near Field Scanning Optical Microscopy (NSOM). Using total internal reflection of a p- or s- polarized laser beam, optical scattering from defects located on the surface itself as well as in the subsurface layer of polished fused silica has been measured by NSOM. The local scattering intensity has been compared with simultaneously measured surface topography. In addition, surface defects intentionally created on a fused silica surface by nano-indentation have been used to establish a correlation between optical scattering of s- and p- polarized light, surface morphology and the well known subsurface stress-field associated with nano-indentation.

Physical Description

7 p.

Notes

INIS; OSTI as DE98054774

Other: FDE: PDF; PL:

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  • 29. annual Boulder damage symposium on optical materials for high power lasers, Boulder, CO (United States), 6-8 Oct 1997

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  • Other: DE98054774
  • Report No.: UCRL-JC--129506
  • Report No.: CONF-9710116--
  • Office of Scientific & Technical Information Report Number: 305338
  • Archival Resource Key: ark:/67531/metadc679481

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  • January 21, 1998

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

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  • April 6, 2017, 6:02 p.m.

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Yan, M.; Wang, L.; Siekhaus, W.; Kozlowski, M.; Yang, J. & Mohideen, U. Defect study in fused silica using near field scanning optical microscopy, article, January 21, 1998; California. (digital.library.unt.edu/ark:/67531/metadc679481/: accessed September 25, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.