Single event upsets calculated from new ENDF/B-VI proton and neutron data up to 150 MeV

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Description

Single-event upsets (SEU) in microelectronics are calculated from newly-developed silicon nuclear reaction recoil data that extend up to 150 MeV, for incident protons and neutrons. Calculated SEU cross sections are compared with measured data.

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5 p.

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Chadwick, M. B. & Normand, E. June 1999.

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  • Chadwick, M. B. Los Alamos National Lab., NM (United States). Theoretical Div.
  • Normand, E. Boeing Military Aircraft and Missile Systems, Seattle, WA (United States)

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Description

Single-event upsets (SEU) in microelectronics are calculated from newly-developed silicon nuclear reaction recoil data that extend up to 150 MeV, for incident protons and neutrons. Calculated SEU cross sections are compared with measured data.

Physical Description

5 p.

Notes

INIS; OSTI as DE99002827

Source

  • 1999 IEEE nuclear and space radiation effects conference, Norfolk, VA (United States), 12-16 Jul 1999

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  • Other: DE99002827
  • Report No.: LA-UR--99-696
  • Report No.: CONF-990706--
  • Grant Number: W-7405-ENG-36
  • Office of Scientific & Technical Information Report Number: 353443
  • Archival Resource Key: ark:/67531/metadc679175

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Office of Scientific & Technical Information Technical Reports

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Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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Creation Date

  • June 1999

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

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  • Feb. 25, 2016, 2:27 p.m.

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Chadwick, M. B. & Normand, E. Single event upsets calculated from new ENDF/B-VI proton and neutron data up to 150 MeV, article, June 1999; New Mexico. (digital.library.unt.edu/ark:/67531/metadc679175/: accessed December 12, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.