High resolution I{sub DDQ} characterization and testing -- Practical issues

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Description

I{sub DDQ} testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I{sub DDQ} characterization and testing (from the sub-nA to {micro}A level) and outlines test hardware and software issues. The physical basis of I{sub DDQ} is discussed. Methods for statistical analysis of I{sub DDQ} data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated.

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11 p.

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Righter, A.W.; Soden, J.M. & Beegle, R.W. December 1, 1996.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

I{sub DDQ} testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I{sub DDQ} characterization and testing (from the sub-nA to {micro}A level) and outlines test hardware and software issues. The physical basis of I{sub DDQ} is discussed. Methods for statistical analysis of I{sub DDQ} data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated.

Physical Description

11 p.

Notes

OSTI as DE97000741

Source

  • 1996 Institute of Electrical and Electronics Engineers (IEEE) international test conference, Washington, DC (United States), 21-25 Oct 1996

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  • Other: DE97000741
  • Report No.: SAND--96-2462C
  • Report No.: CONF-9610208--1
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 414408
  • Archival Resource Key: ark:/67531/metadc678710

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • December 1, 1996

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

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  • April 13, 2016, 2:09 p.m.

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Righter, A.W.; Soden, J.M. & Beegle, R.W. High resolution I{sub DDQ} characterization and testing -- Practical issues, article, December 1, 1996; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc678710/: accessed November 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.