Determining Two-Port S-Parameters from a One-Port Measurement Using a Novel Impedance-State Test Chip

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Description

A novel custom high-speed test chip and data reduction technique that allows for the accurate determination of the two-port S-parameters of a passive network from a set of one-port measurements is presented. A typical application for this technique is high-speed integrated circuit package characterization where one-port is of a microelectronic size scale and inside the package. The test chip is designed to operate up to 20 GHz.

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6 p.

Creation Information

Hietala, V.M. March 4, 1999.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 19 times . More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA
    Place of Publication: Albuquerque, New Mexico

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Description

A novel custom high-speed test chip and data reduction technique that allows for the accurate determination of the two-port S-parameters of a passive network from a set of one-port measurements is presented. A typical application for this technique is high-speed integrated circuit package characterization where one-port is of a microelectronic size scale and inside the package. The test chip is designed to operate up to 20 GHz.

Physical Description

6 p.

Notes

OSTI as DE00004196

Medium: P; Size: 6 pages

Source

  • 1999 IEEE MTT-S International Microwave Symposium, Anaheim, CA (US), 06/13/1999--06/19/1999

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  • Report No.: SAND98-2767C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 4196
  • Archival Resource Key: ark:/67531/metadc678640

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  • March 4, 1999

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

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  • April 11, 2017, 12:58 p.m.

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Hietala, V.M. Determining Two-Port S-Parameters from a One-Port Measurement Using a Novel Impedance-State Test Chip, article, March 4, 1999; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc678640/: accessed September 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.