Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales

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Description

RXF is a new technique for studying thin films. Here, it is applied to study of thermally grown oxide scales. Evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and the evolution of alumina scales on {beta}-NiAl are investigated. The technique provides scale composition and depth profile information, scale thicknesses and growth rates, and information about transient phase evolution.

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15 p.

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Koshelev, I.; Paulikas, A. P. & Veal, B. W. October 1996.

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Description

RXF is a new technique for studying thin films. Here, it is applied to study of thermally grown oxide scales. Evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and the evolution of alumina scales on {beta}-NiAl are investigated. The technique provides scale composition and depth profile information, scale thicknesses and growth rates, and information about transient phase evolution.

Physical Description

15 p.

Notes

OSTI as DE97001157

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  • 190. meeting of the Electrochemical Society and technical exhibition, San Antonio, TX (United States), 6-11 Oct 1996

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  • Other: DE97001157
  • Report No.: ANL/MSD/CP--91226
  • Report No.: CONF-961040--14
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 436383
  • Archival Resource Key: ark:/67531/metadc678475

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  • October 1996

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  • July 25, 2015, 2:20 a.m.

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  • Dec. 11, 2015, 2:58 p.m.

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Koshelev, I.; Paulikas, A. P. & Veal, B. W. Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales, article, October 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc678475/: accessed September 25, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.