Reliability performance of pulse discharge capacitors

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Description

There is a void of public specifications for pulse discharge capacitor applications. Sandia National Laboratories has developed, over the past 25 years, specifications and test procedures for evaluating capacitor designs for this specialized use. There are three primary destructive tests that are used to assess the reliability potential of a given design at a required rated voltage. These are ultimate short time breakdown strength, life at voltage, and pulse discharge life. The strategy of the method is to accelerate the test conditions so that failures are observable and then extrapolate to the desired use conditions where the failure rates are ... continued below

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6 p.

Creation Information

Edwards, L.R. February 1, 1997.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 18 times . More information about this article can be viewed below.

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Author

  • Edwards, L.R. Sandia National Labs., Albuquerque, NM (United States). Capacitors, Magnetics, and Interconnections Dept.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

There is a void of public specifications for pulse discharge capacitor applications. Sandia National Laboratories has developed, over the past 25 years, specifications and test procedures for evaluating capacitor designs for this specialized use. There are three primary destructive tests that are used to assess the reliability potential of a given design at a required rated voltage. These are ultimate short time breakdown strength, life at voltage, and pulse discharge life. The strategy of the method is to accelerate the test conditions so that failures are observable and then extrapolate to the desired use conditions where the failure rates are low. This paper will present the statistical methodologies employed to analyze experimental data and to provide a point estimate of reliability with a lower confidence bound as a function of rated voltage. In addition, methods for establishing lot-acceptance-criteria specifications will be discussed. The techniques will be illustrated with actual data on a commercially available, low-inductance, pulse-discharge capacitor. The capacitor is an impregnated dual dielectric (mica-paper/polymer film), extended-foil type.

Physical Description

6 p.

Notes

OSTI as DE97002534

Source

  • 17. annual capacitor and resistor technology symposium, Jupiter, FL (United States), 24-27 Mar 1997

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  • Other: DE97002534
  • Report No.: SAND--97-0156C
  • Report No.: CONF-970357--1
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 453483
  • Archival Resource Key: ark:/67531/metadc677029

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • February 1, 1997

Added to The UNT Digital Library

  • July 25, 2015, 2:21 a.m.

Description Last Updated

  • April 13, 2016, 6:48 p.m.

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Edwards, L.R. Reliability performance of pulse discharge capacitors, article, February 1, 1997; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc677029/: accessed October 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.