HRTEM analysis of solid precipitates in Xe-implanted aluminum

PDF Version Also Available for Download.

Description

High-resolution TEM was carried out to determine shape and atomic arrangement of solid Xe precipitates in Al. Polycrystalline Al TEM specimens were implanted with 30 keV Xe{sup +} at RT to a dose of 3x10{sup 20} ions/m{sup 2} and then annealed at 523 K. Below a size 4 nm dia, the Xe precipitates are solid with an fcc crystal structure mesotacticly aligned with the Al lattice. In HRTEM along [011] projection, the difference in the lattice parameters of solid Xe and Al produces a precipitate image dominated by a 2-D Moire pattern that repeats in both the <001> and <111> ... continued below

Physical Description

9 p.

Creation Information

Allen, C.W.; Birtcher, R.; Ishikawa, N.; Furuya, K. & Awaji, M. September 1, 1996.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Authors

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

High-resolution TEM was carried out to determine shape and atomic arrangement of solid Xe precipitates in Al. Polycrystalline Al TEM specimens were implanted with 30 keV Xe{sup +} at RT to a dose of 3x10{sup 20} ions/m{sup 2} and then annealed at 523 K. Below a size 4 nm dia, the Xe precipitates are solid with an fcc crystal structure mesotacticly aligned with the Al lattice. In HRTEM along [011] projection, the difference in the lattice parameters of solid Xe and Al produces a precipitate image dominated by a 2-D Moire pattern that repeats in both the <001> and <111> directions every 3 Al (or 2 Xe) lattice spacings. Multi-slice image simulations, using a 3-D atomic model, demonstrates that the precipitates are tetradecahedra with faces parallel to the dense {l_brace}111{r_brace} planes and the {l_brace}100{r_brace} planes. Off-Bragg illumination of the precipitates minimizes Al lattice fringes and generates precipitate images which are in good agreement with the model.

Physical Description

9 p.

Notes

OSTI as DE97000984

Source

  • IBMM `96: 10. international conference on ion beam modification of materials, Albuquerque, NM (United States), 1-6 Sep 1996

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE97000984
  • Report No.: ANL/MSD/CP--89719
  • Report No.: CONF-960994--15
  • Grant Number: W-31-109-ENG-38
  • Office of Scientific & Technical Information Report Number: 434927
  • Archival Resource Key: ark:/67531/metadc676666

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • September 1, 1996

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

Description Last Updated

  • Dec. 14, 2015, 6:25 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 4

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Allen, C.W.; Birtcher, R.; Ishikawa, N.; Furuya, K. & Awaji, M. HRTEM analysis of solid precipitates in Xe-implanted aluminum, article, September 1, 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc676666/: accessed November 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.