Radiation hardness assurances categories for COTS technologies

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Description

A comparison of the radiation tolerance of three commercial, and one radiation hardened SRAM is presented for four radiation environments. This work has shown the difficulty associated with strictly categorizing a device based solely on its radiation response, since its category depends on the specific radiation environment considered. For example, the 3.3-V Paradigm SRAM could be considered a radiation-tolerant device except for its SEU response. A more useful classification depends on the methods the manufacturer uses to ensure radiation hardness, i.e. whether specific design and process techniques have been used to harden the device. Finally, this work has shown that ... continued below

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5 p.

Creation Information

Hash, G.L.; Shaneyfelt, M.R.; Sexton, F.W. & Winokur, P.S. March 1, 1997.

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This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this report can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

A comparison of the radiation tolerance of three commercial, and one radiation hardened SRAM is presented for four radiation environments. This work has shown the difficulty associated with strictly categorizing a device based solely on its radiation response, since its category depends on the specific radiation environment considered. For example, the 3.3-V Paradigm SRAM could be considered a radiation-tolerant device except for its SEU response. A more useful classification depends on the methods the manufacturer uses to ensure radiation hardness, i.e. whether specific design and process techniques have been used to harden the device. Finally, this work has shown that burned-in devices may fail functionally as much as 50% lower in total dose environments than non-burned-in devices. No burn-in effect was seen in dose-rate upset, latchup, or SEE environments. The user must ensure that total dose lot acceptance testing was performed on burned-in devices.

Physical Description

5 p.

Notes

INIS; OSTI as DE97004380

Source

  • 34. IEEE nuclear and space radiation effects conference, Snowmass, CO (United States), 21-25 Jul 1997

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  • Other: DE97004380
  • Report No.: SAND--97-0559C
  • Report No.: CONF-970711--1
  • Grant Number: AC04-94AL85000
  • DOI: 10.2172/486144 | External Link
  • Office of Scientific & Technical Information Report Number: 486144
  • Archival Resource Key: ark:/67531/metadc676556

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  • March 1, 1997

Added to The UNT Digital Library

  • July 25, 2015, 2:21 a.m.

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  • June 23, 2016, 10:32 a.m.

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Hash, G.L.; Shaneyfelt, M.R.; Sexton, F.W. & Winokur, P.S. Radiation hardness assurances categories for COTS technologies, report, March 1, 1997; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc676556/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.