The mechanism of sputter-induced orientation change in YBCO films on MgO (001)

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The mechanisms of the sputter-induced orientation change in YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}(YBCO) films grown on MgO (001) substrates by pulsed organometallic beam epitaxy (POMBE) are investigated by x-ray diffraction. Rutherford backscatter spectroscopy (RBS), cross-section TEM (XTEM) and microanalysis. It is found that the W atom implantation concurring with the ion sputtering plays an important role in effecting the orientation change. This implantation changes the surface structure of the substrate and induces an intermediate layer in the initial growth of the YBCO film, which in turn acts as a template that induces the orientation change. It seems that the surface morphology ... continued below

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8 p.

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Huang, Y.; Vuchic, B.V.; Baldo, P.; Merkle, K.L.; Buchholz, D.B.; Mahajan, S. et al. December 1, 1996.

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Description

The mechanisms of the sputter-induced orientation change in YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}(YBCO) films grown on MgO (001) substrates by pulsed organometallic beam epitaxy (POMBE) are investigated by x-ray diffraction. Rutherford backscatter spectroscopy (RBS), cross-section TEM (XTEM) and microanalysis. It is found that the W atom implantation concurring with the ion sputtering plays an important role in effecting the orientation change. This implantation changes the surface structure of the substrate and induces an intermediate layer in the initial growth of the YBCO film, which in turn acts as a template that induces the orientation change. It seems that the surface morphology change caused by ion sputtering has only a minor effect on the orientation change.

Physical Description

8 p.

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INIS; OSTI as DE97001992

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  • 1996 Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 2-6 Dec 1996

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  • Other: DE97001992
  • Report No.: ANL/MSD/CP--91913
  • Report No.: CONF-961202--58
  • Grant Number: W-31109-ENG-38
  • DOI: 10.2172/432993 | External Link
  • Office of Scientific & Technical Information Report Number: 432993
  • Archival Resource Key: ark:/67531/metadc676091

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  • December 1, 1996

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  • July 25, 2015, 2:20 a.m.

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  • Aug. 23, 2016, 3:55 p.m.

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Huang, Y.; Vuchic, B.V.; Baldo, P.; Merkle, K.L.; Buchholz, D.B.; Mahajan, S. et al. The mechanism of sputter-induced orientation change in YBCO films on MgO (001), report, December 1, 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc676091/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.