Failure probability prediction of dielectric ceramics in multilayer capacitors

PDF Version Also Available for Download.

Description

Dielectric ceramics in multilayer capacitors are subjected to manufacturing or service thermomechanical stresses which, if severe enough, will cause mechanical failure and perhaps subsequent loss of electrical function. Strength of monolithic ceramics is probabilistic in nature; however, probabilistic design of such electronic ceramic components generally has not been used by manufacturers and end-users of these components. To illustrate how probabilistic design may be utilized for small components, the present study demonstrates the applicability of an existing probabilistic life design computer code in the prediction of failure probability of a dielectric ceramic in an arbitrary multilayer capacitor. Issues involving the generation ... continued below

Physical Description

11 p.

Creation Information

Wereszczak, A.A.; Breder, K.; Ferber, M.K.; Bridge, R.J.; Riester, L. & Kirkland, T.P. November 1, 1998.

Context

This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 51 times , with 4 in the last month . More information about this report can be viewed below.

Who

People and organizations associated with either the creation of this report or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this report. Follow the links below to find similar items on the Digital Library.

Description

Dielectric ceramics in multilayer capacitors are subjected to manufacturing or service thermomechanical stresses which, if severe enough, will cause mechanical failure and perhaps subsequent loss of electrical function. Strength of monolithic ceramics is probabilistic in nature; however, probabilistic design of such electronic ceramic components generally has not been used by manufacturers and end-users of these components. To illustrate how probabilistic design may be utilized for small components, the present study demonstrates the applicability of an existing probabilistic life design computer code in the prediction of failure probability of a dielectric ceramic in an arbitrary multilayer capacitor. Issues involving the generation of representative strength and fatigue data for specimens at this small scale and the ultimate failure probability prediction of dielectric ceramics in multilayer capacitors are presented. Additionally, alternative means to generate a strength distribution as input for the probabilistic life design computer codes which are under consideration by the authors are discussed.

Physical Description

11 p.

Notes

OSTI as DE99000366

Source

  • 100. annual meeting of the American Ceramic Society, Cincinnati, OH (United States), 3-6 May 1998

Language

Item Type

Identifier

Unique identifying numbers for this report in the Digital Library or other systems.

  • Other: DE99000366
  • Report No.: ORNL/CP--98893
  • Report No.: CONF-980521--
  • Grant Number: AC05-96OR22464
  • DOI: 10.2172/290938 | External Link
  • Office of Scientific & Technical Information Report Number: 290938
  • Archival Resource Key: ark:/67531/metadc676037

Collections

This report is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this report?

When

Dates and time periods associated with this report.

Creation Date

  • November 1, 1998

Added to The UNT Digital Library

  • July 25, 2015, 2:20 a.m.

Description Last Updated

  • Jan. 19, 2016, 1:38 p.m.

Usage Statistics

When was this report last used?

Yesterday: 0
Past 30 days: 4
Total Uses: 51

Interact With This Report

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Wereszczak, A.A.; Breder, K.; Ferber, M.K.; Bridge, R.J.; Riester, L. & Kirkland, T.P. Failure probability prediction of dielectric ceramics in multilayer capacitors, report, November 1, 1998; Tennessee. (digital.library.unt.edu/ark:/67531/metadc676037/: accessed October 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.