Characterization of SiC fibers by soft x-ray photoelectron and photoabsorption spectroscopies and scanning Auger microscopy

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Synchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers produced by CVD on a W core and followed by a C passivating layer. Depth profiling of the fiber through the C/SiC interface was done by making Si 2p and C 1s core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar{sup +} sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed versus depth, indicating no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominantely graphite-like and those of the CVD ... continued below

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8 p.

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Ma, Qing; McDowell, M. W. & Rosenberg, R. A. August 1996.

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Synchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers produced by CVD on a W core and followed by a C passivating layer. Depth profiling of the fiber through the C/SiC interface was done by making Si 2p and C 1s core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar{sup +} sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed versus depth, indicating no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominantely graphite-like and those of the CVD SiC coatings are microcrystalline, with disorder present to some extent in both cases.

Physical Description

8 p.

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INIS; OSTI as DE96013466

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  • Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996

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  • Other: DE96013466
  • Report No.: ANL/APS/CP--90604
  • Report No.: CONF-960401--67
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 378182
  • Archival Resource Key: ark:/67531/metadc674914

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  • August 1996

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  • July 25, 2015, 2:20 a.m.

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  • Nov. 19, 2015, 12:24 p.m.

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Ma, Qing; McDowell, M. W. & Rosenberg, R. A. Characterization of SiC fibers by soft x-ray photoelectron and photoabsorption spectroscopies and scanning Auger microscopy, article, August 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc674914/: accessed September 26, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.