Direct sublattice imaging of interface dislocation structures in CdTe/GaAs(001)

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Description

This paper presents directly interpretable atomic resolution images of dislocation structures at interfaces in CdTe/GaAs(001) systems. This is achieved using the technique of Z-contrast imaging in a 300 kV scanning transmission electron microscope in conjunction with maximum entropy image analysis. In addition to being used to further the understanding of the relation between growth conditions and exhibited properties, the data presented provides direct information on the atomic arrangements at dislocation cores.

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7 p.

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McGibbon, A.J.; Pennycook, S.J.; Angelo, J.E. & Mills, M.J. January 1995.

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Description

This paper presents directly interpretable atomic resolution images of dislocation structures at interfaces in CdTe/GaAs(001) systems. This is achieved using the technique of Z-contrast imaging in a 300 kV scanning transmission electron microscope in conjunction with maximum entropy image analysis. In addition to being used to further the understanding of the relation between growth conditions and exhibited properties, the data presented provides direct information on the atomic arrangements at dislocation cores.

Physical Description

7 p.

Notes

OSTI as DE95009031

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  • Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 28 Nov - 9 Dec 1994

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  • Other: DE95009031
  • Report No.: CONF-941144--113
  • Grant Number: AC05-84OR21400;AC04-94AL85000
  • DOI: 10.2172/102250 | External Link
  • Office of Scientific & Technical Information Report Number: 36580
  • Archival Resource Key: ark:/67531/metadc674240

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  • January 1995

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  • July 25, 2015, 2:20 a.m.

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  • April 11, 2016, 3:19 p.m.

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McGibbon, A.J.; Pennycook, S.J.; Angelo, J.E. & Mills, M.J. Direct sublattice imaging of interface dislocation structures in CdTe/GaAs(001), article, January 1995; Tennessee. (digital.library.unt.edu/ark:/67531/metadc674240/: accessed November 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.