Preparation of microporous films with sub nanometer pores and their characterization using stress and FTIR measurements

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The authors have used a novel technique, measurement of stress isotherms in microporous thin films, as a means of characterizing porosity. The stress measurement was carried out by applying sol-gel thin films on a thin silicon substrate and monitoring the curvature of the substrate under a controlled atmosphere of various vapors. The magnitude of macroscopic bending stress developed in microporous films depends on the relative pressure and molar volume of the adsorbate and reaches a value of 180 MPa for a relative vapor pressure, P/Po = 0.001, of methanol. By using a series of molecules, and observing both the magnitude ... continued below

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6 p.

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Samuel, J.; Hurd, A.J.; Swoll, F. van; Frink, L.J.D.; Contakes, S.C. & Brinker, C.J. June 1, 1996.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

The authors have used a novel technique, measurement of stress isotherms in microporous thin films, as a means of characterizing porosity. The stress measurement was carried out by applying sol-gel thin films on a thin silicon substrate and monitoring the curvature of the substrate under a controlled atmosphere of various vapors. The magnitude of macroscopic bending stress developed in microporous films depends on the relative pressure and molar volume of the adsorbate and reaches a value of 180 MPa for a relative vapor pressure, P/Po = 0.001, of methanol. By using a series of molecules, and observing both the magnitude and the kinetics of stress development while changing the relative pressure, they have determined the pore size of microporous thin films. FTIR measurements were used to acquire adsorption isotherms and to compare pore emptying to stress development, about 80% of the change in stress takes place with no measurable change in the amount adsorbed. The authors show that for sol-gel films, pore diameters can be controlled in the range of 5--8 {angstrom} by ``solvent templating``.

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6 p.

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OSTI as DE96010536

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  • Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996

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  • Other: DE96010536
  • Report No.: SAND--96-1279C
  • Report No.: CONF-960401--36
  • Grant Number: AC04-94AL85000
  • DOI: 10.2172/244629 | External Link
  • Office of Scientific & Technical Information Report Number: 244629
  • Archival Resource Key: ark:/67531/metadc671121

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  • June 1, 1996

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • June 27, 2016, 2:55 p.m.

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Samuel, J.; Hurd, A.J.; Swoll, F. van; Frink, L.J.D.; Contakes, S.C. & Brinker, C.J. Preparation of microporous films with sub nanometer pores and their characterization using stress and FTIR measurements, report, June 1, 1996; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc671121/: accessed April 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.