Structure factor measurement in TiAl and silicon

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Description

It proved impossible to obtain results with sufficient precision for TiAl reproducibly (<0.1%) from samples of different thicknesses. In order to ascertain the origin of this inconsistency, this study concentrates on the development of the experimental and theoretical tools required for such refinement and measurements for Si have been performed.

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4 p.

Creation Information

Swaminathan, S.; Wiezorek, J.M.; Jones, I.P.; Zaluzec, N.J.; Fraser & Maher, D.M. March 1, 1996.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 47 times , with 8 in the last month . More information about this article can be viewed below.

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  • Swaminathan, S.
  • Wiezorek, J.M.
  • Jones, I.P. Birmingham Univ. (United Kingdom). Dept. of Metallurgy and Materials
  • Zaluzec, N.J. Argonne National Lab., IL (United States)
  • Fraser Ohio State Univ. Research Foundation, Columbus, OH (United States). Dept. of Materials Science and Engineering
  • Maher, D.M. North Carolina State Univ., Raleigh, NC (United States). Dept. of Materials Science and Engineering

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Description

It proved impossible to obtain results with sufficient precision for TiAl reproducibly (<0.1%) from samples of different thicknesses. In order to ascertain the origin of this inconsistency, this study concentrates on the development of the experimental and theoretical tools required for such refinement and measurements for Si have been performed.

Physical Description

4 p.

Notes

OSTI as DE96012710

Source

  • Microscopy Society of America annual meeting, Kansas City, MO (United States), 14-18 Aug 1995

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  • Other: DE96012710
  • Report No.: ANL/MSD/CP--89508
  • Report No.: CONF-9508163--4
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 267570
  • Archival Resource Key: ark:/67531/metadc670952

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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Creation Date

  • March 1, 1996

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

Description Last Updated

  • Dec. 16, 2015, 5:21 p.m.

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Swaminathan, S.; Wiezorek, J.M.; Jones, I.P.; Zaluzec, N.J.; Fraser & Maher, D.M. Structure factor measurement in TiAl and silicon, article, March 1, 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc670952/: accessed November 15, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.