Penta-prism long trace profiler (PPLTP) for measurement of grazing incidence space optics

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Description

The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measurement of the figure and mid- frequency roughness of x-ray mirrors. The standard configuration requires that the surface tested lie in a horizontal plane as the optical head is scanned along a horizontal line. For applications where gravity-induced sag of the surface cannot be tolerated, such as in x-ray telescope mirror metrology, it is desirable to measure the mirror as it is mounted in a vertical configuration. By making simple modifications to the standard LTP system, we have demonstrated that it is ... continued below

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8 p.

Creation Information

Qian, S.; Li, H. & Takacs, P.Z. May 1, 1996.

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Description

The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measurement of the figure and mid- frequency roughness of x-ray mirrors. The standard configuration requires that the surface tested lie in a horizontal plane as the optical head is scanned along a horizontal line. For applications where gravity-induced sag of the surface cannot be tolerated, such as in x-ray telescope mirror metrology, it is desirable to measure the mirror as it is mounted in a vertical configuration. By making simple modifications to the standard LTP system, we have demonstrated that it is possible to use the LTP principle to measure the surface of x- ray mirrors and mandrels mounted in the vertical orientation. The major change in the LTP system is the use of a penta prism on a vertical translation stage to direct the probe beam onto the surface and the addition of a precision rotation stage to hold the test object. A 3-D map of the surface topography of the complete cylindrical asphere can be generated quite easily with this technique. Measurements with a prototype system indicate a slope error accuracy of better than 1 microradian is possible, with a figure error repeatability of better than 50 nm. 19 refs., 4 figs.

Physical Description

8 p.

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OSTI as DE96011810

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  • Denver `96, Denver, CO (United States), 4-9 Aug 1996

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  • Other: DE96011810
  • Report No.: BNL--62826
  • Report No.: CONF-9608112--1
  • Grant Number: AC02-76CH00016
  • DOI: 10.2172/281879 | External Link
  • Office of Scientific & Technical Information Report Number: 281879
  • Archival Resource Key: ark:/67531/metadc670412

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Creation Date

  • May 1, 1996

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • Dec. 3, 2015, 5:47 p.m.

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Qian, S.; Li, H. & Takacs, P.Z. Penta-prism long trace profiler (PPLTP) for measurement of grazing incidence space optics, report, May 1, 1996; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc670412/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.