A general technique for characterizing x-ray position sensitive arrays

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We present a general statistical technique for characterizing x-ray sensitive linear diode arrays and CCD arrays. We apply this technique to characterize the response of a linear diode array, Princeton Instrument model X-PDA, and a virtual phase CCD array, TI 4849, to direct illumination by x-rays. We find that the response of the linear array is linearly proportional to the incident intensity and uniform over its length to within 2 %. Its quantum efficiency is 38 % for Cu K{sub {alpha}} x-rays. The resolution function is evaluated from the spatial autocorrelation function and falls to 10 % of its peak ... continued below

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34 p.

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Dufresne, E.; Bruning, R.; Sutton, M.; Rodricks, B. & Stephenson, G.B. March 1, 1994.

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Description

We present a general statistical technique for characterizing x-ray sensitive linear diode arrays and CCD arrays. We apply this technique to characterize the response of a linear diode array, Princeton Instrument model X-PDA, and a virtual phase CCD array, TI 4849, to direct illumination by x-rays. We find that the response of the linear array is linearly proportional to the incident intensity and uniform over its length to within 2 %. Its quantum efficiency is 38 % for Cu K{sub {alpha}} x-rays. The resolution function is evaluated from the spatial autocorrelation function and falls to 10 % of its peak value after one pixel. On the other hand, the response of the CCD detecting system to direct x-ray exposure is non-linear. To properly quantify the scattered x-rays, one must correct for the non- linearity. The resolution is two pixels along the serial transfer direction. We characterize the noise of the CCD and propose a model that takes into account the non-linearity and the resolution function to estimate the quantum efficiency of the detector. The quantum efficiency is 20 %.

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34 p.

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INIS; OSTI as DE96005948

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  • Other Information: PBD: Mar 1994

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  • Other: DE96005948
  • Report No.: ANL/XFD/PP--82307
  • Grant Number: W-31109-ENG-38
  • DOI: 10.2172/207431 | External Link
  • Office of Scientific & Technical Information Report Number: 207431
  • Archival Resource Key: ark:/67531/metadc669996

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Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • March 1, 1994

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • Dec. 15, 2015, 6:53 p.m.

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Dufresne, E.; Bruning, R.; Sutton, M.; Rodricks, B. & Stephenson, G.B. A general technique for characterizing x-ray position sensitive arrays, report, March 1, 1994; Illinois. (digital.library.unt.edu/ark:/67531/metadc669996/: accessed October 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.