EBIT (Electron Beam Ion Trap), N-Division Experimental Physics. Annual report, 1994

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The experimental groups in the Electron Beam Ion Trap (EBIT) program continue to perform front-line research with trapped and extracted highly charged ions (HCI) in the areas of ion/surface interactions, atomic spectroscopy, electron-ion interaction and structure measurements, highly charged ion confinement, and EBIT development studies. The ion surface/interaction studies which were initiated five years ago have reached a stage where they an carry out routine investigations, as well as produce breakthrough results towards the development of novel nanotechnology. At EBIT and SuperEBIT studies of the x-ray emission from trapped ions continue to produce significant atomic structure data with high precision ... continued below

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124 p.

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Schneider, D. October 1, 1995.

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The experimental groups in the Electron Beam Ion Trap (EBIT) program continue to perform front-line research with trapped and extracted highly charged ions (HCI) in the areas of ion/surface interactions, atomic spectroscopy, electron-ion interaction and structure measurements, highly charged ion confinement, and EBIT development studies. The ion surface/interaction studies which were initiated five years ago have reached a stage where they an carry out routine investigations, as well as produce breakthrough results towards the development of novel nanotechnology. At EBIT and SuperEBIT studies of the x-ray emission from trapped ions continue to produce significant atomic structure data with high precision for few electron systems of high-Z ions. Furthermore, diagnostics development for magnetic and laser fusion, supporting research for the x-ray laser and weapons programs, and laboratory astrophysics experiments in support of NASA`s astrophysics program are a continuing effort. The two-electron contributions to the binding energy of helium like ions were measured for the first time. The results are significant because their precision is an order of magnitude better than those of competing measurements at accelerators, and the novel technique isolates the energy corrections that are the most interesting. The RETRAP project which was initiated three years ago has reached a stage where trapping, confining and electronic cooling of HCI ions up to Th{sup 80+} can be performed routinely. Measurements of the rates and cross sections for electron transfer from H{sub 2} performed to determine the lifetime of HCI up to Xe{sup q+} and Th{sup q+} (35 {le} q {le} 80) have been studied at mean energies estimated to be {approximately} 5 q eV. This combination of heavy ions with very high charges and very low energies is rare in nature, but may be encountered in planned fusion energy demonstration devices, in highly charged ion sources, or in certain astrophysical events.

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124 p.

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INIS; OSTI as DE96004943

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  • Other Information: PBD: Oct 1995

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  • Other: DE96004943
  • Report No.: UCRL-ID--121572
  • Grant Number: W-7405-ENG-48;AC03-76SF00098
  • DOI: 10.2172/188637 | External Link
  • Office of Scientific & Technical Information Report Number: 188637
  • Archival Resource Key: ark:/67531/metadc669652

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  • October 1, 1995

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  • June 29, 2015, 9:42 p.m.

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  • Feb. 18, 2016, 12:34 p.m.

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Schneider, D. EBIT (Electron Beam Ion Trap), N-Division Experimental Physics. Annual report, 1994, report, October 1, 1995; California. (digital.library.unt.edu/ark:/67531/metadc669652/: accessed December 13, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.