Life-testing oxide confined VCSELs: Too good to last?

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Description

The use of native oxides (selective oxidation) in vertical cavity surface emitting lasers has produced dramatic improvements in these laser diodes but has also been suspected of causing poor reliability because of incidental reports of short lifetimes and physical considerations. Here we discuss the results of thousands of hours life-tests for oxide confined and implant confined devices at current densities from 1 to 12 kA/cm{sup 2}. There was a single infant mortality failure from a sample of 14 oxide confined lasers with the remainder showing relatively stable operation. The failed device is analyzed in terms of light current characteristics and ... continued below

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9 p.

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Lear, K.L.; Kilcoyne, S.P.; Schneider, R.P. Jr. & Nevers, J.A. March 1, 1996.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

The use of native oxides (selective oxidation) in vertical cavity surface emitting lasers has produced dramatic improvements in these laser diodes but has also been suspected of causing poor reliability because of incidental reports of short lifetimes and physical considerations. Here we discuss the results of thousands of hours life-tests for oxide confined and implant confined devices at current densities from 1 to 12 kA/cm{sup 2}. There was a single infant mortality failure from a sample of 14 oxide confined lasers with the remainder showing relatively stable operation. The failed device is analyzed in terms of light current characteristics and near-field electroluminescence images, and potential screening criteria are proposed.

Physical Description

9 p.

Notes

OSTI as DE96006989

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  • Photonics West `96: conference on quantum well and superlattice physics VI, San Jose, CA (United States), 27 Jan - 2 Feb 1996

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  • Other: DE96006989
  • Report No.: SAND--96-0696C
  • Report No.: CONF-960163--8
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 220598
  • Archival Resource Key: ark:/67531/metadc667960

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Office of Scientific & Technical Information Technical Reports

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  • March 1, 1996

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • April 13, 2016, 2:46 p.m.

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Lear, K.L.; Kilcoyne, S.P.; Schneider, R.P. Jr. & Nevers, J.A. Life-testing oxide confined VCSELs: Too good to last?, article, March 1, 1996; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc667960/: accessed September 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.