Sub-micron scale conduction processes on clean surfaces

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Electrical conductance has been measured in-situ in two dimensions in the Ag/Si(111) system as a function of incident adatom flux rate with a 4-probe method. A conductance study in a 3-D conical structure was also made using field emission. For the 2-D study, the origin of conduction is still unclear, as transport by percolating Ag clusters and conduction through the substrate lvia electrons from the film have both been suggested. Experiments varying the flux rate were conducted to decide between the two. Smoother films are expected at lower growth rates which would result in faster drops in the 4-probe voltage; ... continued below

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46 p.

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Kimberlin, K. June 19, 1995.

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  • Ames Laboratory
    Publisher Info: Ames Lab., IA (United States)
    Place of Publication: Iowa

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Description

Electrical conductance has been measured in-situ in two dimensions in the Ag/Si(111) system as a function of incident adatom flux rate with a 4-probe method. A conductance study in a 3-D conical structure was also made using field emission. For the 2-D study, the origin of conduction is still unclear, as transport by percolating Ag clusters and conduction through the substrate lvia electrons from the film have both been suggested. Experiments varying the flux rate were conducted to decide between the two. Smoother films are expected at lower growth rates which would result in faster drops in the 4-probe voltage; however the 4-probe voltage vs deposition time for various flux rates collapse into a universal curve which indicates that the morphology is not relevant and supports through the substrate. In the 3-D conductance study, a single, lateral micromachined W protrusion on a silica substrate is examined to identify the factors controlling emission in micromachined structures. The I-V characteristics and emission pattern indicate that miniprotrusions of a few hundred Angstroms, much smaller than the nominal radius of the tip, exist on the tip and are responsible for the emission. Adsorption-desorption events from the background environment are the cause of large fluctuations in the emitting current. Comparison of the emission of a single tip to gated arrays suggest that only a fraction of the tips in the array are emitting.

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46 p.

Notes

OSTI as DE96009543

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  • Other Information: TH: Thesis (Ph.D.)

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  • Other: DE96009543
  • Report No.: IS-T--1720
  • Grant Number: W-7405-ENG-82
  • Office of Scientific & Technical Information Report Number: 215805
  • Archival Resource Key: ark:/67531/metadc667820

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • June 19, 1995

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • Feb. 1, 2016, 1:55 p.m.

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Kimberlin, K. Sub-micron scale conduction processes on clean surfaces, thesis or dissertation, June 19, 1995; Iowa. (digital.library.unt.edu/ark:/67531/metadc667820/: accessed April 23, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.