Infrared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films

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Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the {nu}{sub 3} and {nu}{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm{sup {minus}1}. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and ... continued below

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12 p.

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Webb, J.D.; Moutinho, H.R.; Kazmerski, L.L.; Mueller, C.H.; Rivkin, T.V.; Treece, R.E. et al. April 1, 1996.

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Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the {nu}{sub 3} and {nu}{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm{sup {minus}1}. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the {nu}{sub 4} transverse optical phonon in the lattice- mismatched films below the established value of 544 cm{sup {minus}1} is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

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12 p.

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OSTI as DE96007862

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  • International symposium on integrated ferroelectrics, Tempe, AZ (United States), 17-20 Mar 1996

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  • Other: DE96007862
  • Report No.: NREL/TP--413-20926
  • Report No.: CONF-960371--1
  • Grant Number: AC36-83CH10093
  • Office of Scientific & Technical Information Report Number: 230553
  • Archival Resource Key: ark:/67531/metadc667786

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  • April 1, 1996

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  • June 29, 2015, 9:42 p.m.

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  • March 28, 2016, 6:17 p.m.

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Webb, J.D.; Moutinho, H.R.; Kazmerski, L.L.; Mueller, C.H.; Rivkin, T.V.; Treece, R.E. et al. Infrared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films, article, April 1, 1996; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc667786/: accessed May 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.