Near-plastic threshold indentation and the residual stress in thin films

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In recent studies, the authors used the Interfacial Force Microscope in a nanoindenter mode to survey the nanomechanical properties of Au films grown on various substrates. Quantitative tabulations of the indentation modulus and the maximum shear stress at the plastic threshold showed consistent values over individual samples but a wide variation from substrate to substrate. These values were compared with film properties such as the surface roughness, average grain size and interfacial adhesion and no correlation was found. However, in a subsequent analysis of the results, they found consistencies which support the integrity of the data and point to the ... continued below

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6 p.

Creation Information

Houston, J.E. & Michalske, T.A. July 1, 1996.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

In recent studies, the authors used the Interfacial Force Microscope in a nanoindenter mode to survey the nanomechanical properties of Au films grown on various substrates. Quantitative tabulations of the indentation modulus and the maximum shear stress at the plastic threshold showed consistent values over individual samples but a wide variation from substrate to substrate. These values were compared with film properties such as the surface roughness, average grain size and interfacial adhesion and no correlation was found. However, in a subsequent analysis of the results, they found consistencies which support the integrity of the data and point to the fact that the results are sensitive to some property of the various film/substrate combinations. In the present paper, they discuss these consistencies and show recent measurements which strongly suggest that the property that is being probed is the residual stress in the films caused by their interaction with the substrate surfaces.

Physical Description

6 p.

Notes

OSTI as DE96012936

Source

  • Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996

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  • Other: DE96012936
  • Report No.: SAND--96-1743C
  • Report No.: CONF-960401--62
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 266734
  • Archival Resource Key: ark:/67531/metadc667654

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • July 1, 1996

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • April 13, 2016, 4:01 p.m.

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Houston, J.E. & Michalske, T.A. Near-plastic threshold indentation and the residual stress in thin films, article, July 1, 1996; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc667654/: accessed November 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.