A new approach to texture measurements: Orientation distribution function (ODF) determination by Rietveld refinement

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The preferred orientation of crystal grains within a manufactured part is described most fully by its orientation distribution function (ODF), which is a mapping of the probability of each of the possible grain orientations with respect to the exterior dimensions. Traditionally, an ODF is determined from pole figures for a relatively small number of reflections. These pole figures are measured with x-rays or neutrons using short detector scans over the center of an individual diffraction peak for a large number of different sample orientations. This is efficient if the selected diffraction peaks are reasonably strong (relative to background) and well ... continued below

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6 p.

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Vondreele, R.; Larson, A.; Lawson, A.; Sheldon, R. & Wright, S. September 1, 1996.

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Description

The preferred orientation of crystal grains within a manufactured part is described most fully by its orientation distribution function (ODF), which is a mapping of the probability of each of the possible grain orientations with respect to the exterior dimensions. Traditionally, an ODF is determined from pole figures for a relatively small number of reflections. These pole figures are measured with x-rays or neutrons using short detector scans over the center of an individual diffraction peak for a large number of different sample orientations. This is efficient if the selected diffraction peaks are reasonably strong (relative to background) and well separated, such as in pure fcc and bcc metals. It is also appropriate for constant wavelength sources where collection of individual diffraction peak intensities is a reasonably efficient use of the source. However, the traditional method is not very efficient for neutron diffraction at a spallation source such as LANSCE where the entire diffraction pattern is accessible for each sample setting. Moreover, a different approach is necessary for complicated diffraction patterns, such as from composite materials, intermetallic compounds, high {Tc} ceramics, polyphasic minerals and polymers where there is expected to be heavy overlap of adjacent diffraction peaks. In addition, the large number of settings normally collected for an individual pole figure may not be necessary, since the entire pattern is obtained at each setting. Thus, a new method of ODF analysis needs to be developed to handle the more complex diffraction patterns obtained from modern technological materials as well as take advantage of the particular characteristics of spallation neutron sources. This project sought to develop the experimental procedures and the mathematical treatment needed to produce an orientation distribution function (ODF) directly from full diffraction patterns from a sample in a limited number of orientations.

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6 p.

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INIS; OSTI as DE96014572

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  • Other Information: PBD: [1996]

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  • Other: DE96014572
  • Report No.: LA-UR--96-2820
  • Grant Number: W-7405-ENG-36
  • DOI: 10.2172/286284 | External Link
  • Office of Scientific & Technical Information Report Number: 286284
  • Archival Resource Key: ark:/67531/metadc667172

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  • September 1, 1996

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  • June 29, 2015, 9:42 p.m.

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  • Feb. 29, 2016, 4:48 p.m.

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Vondreele, R.; Larson, A.; Lawson, A.; Sheldon, R. & Wright, S. A new approach to texture measurements: Orientation distribution function (ODF) determination by Rietveld refinement, report, September 1, 1996; New Mexico. (digital.library.unt.edu/ark:/67531/metadc667172/: accessed August 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.