Probing nano-defects in fused silica by near-field scanning optical microscopy

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Nanodefects were artificially introduced into fused silica surface by nano-indenting with a commercial atomic force microscope (AFM). The sample was illuminated at total internal refkction configuration and evanescent waves were detected by near-field scanning optical probe in the constant tip-sample separation mode. The strain fields associated with non-indents were attributed to the contrast mechanism in optical images. Thus the optical image directly maps out the strain distributions associated with these nano-indents. Optical images were taken at different polarizations of the incident light (s and p). Due to different field distributions near sample surface for the two polarizations, strain distributions at ... continued below

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Wang, L March 17, 1998.

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Nanodefects were artificially introduced into fused silica surface by nano-indenting with a commercial atomic force microscope (AFM). The sample was illuminated at total internal refkction configuration and evanescent waves were detected by near-field scanning optical probe in the constant tip-sample separation mode. The strain fields associated with non-indents were attributed to the contrast mechanism in optical images. Thus the optical image directly maps out the strain distributions associated with these nano-indents. Optical images were taken at different polarizations of the incident light (s and p). Due to different field distributions near sample surface for the two polarizations, strain distributions at different depth can be probed. The spatial resolution of this technique is hmited by the probe aperture size and detector sensitivity. This technique may be a useful tool to study laser-induced damage mechanisms in optical materials in microscopic scale.

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1.8 Megabytes

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  • Journal Name: Journal of Applied Physics; Journal Volume: 84; Journal Issue: 6

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  • Other: DE00002409
  • Report No.: UCRL-JC-130635
  • Grant Number: W-7405-Eng-48
  • DOI: 10.1063/1.368454 | External Link
  • Office of Scientific & Technical Information Report Number: 2409
  • Archival Resource Key: ark:/67531/metadc667162

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Office of Scientific & Technical Information Technical Reports

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Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • March 17, 1998

Added to The UNT Digital Library

  • June 29, 2015, 9:42 p.m.

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  • May 6, 2016, 11:23 p.m.

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Wang, L. Probing nano-defects in fused silica by near-field scanning optical microscopy, article, March 17, 1998; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc667162/: accessed November 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.