Comparing TOF-SIMS with laser desorption/photoionization for surface analysis

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TOF-SIMS has become the standard mass spectrometric tool for the molecular analysis of polymeric, organic, and biological surfaces. However, variations in desorption yields, ionization efficiencies, and ion-induced damage of adsorbates still present significant difficulties in the analysis of TOF-SIMS data. Laser desorption combined with photoionization may provide a significant improvement over TOF-SIMS. An instrument exists that has the capability of utilizing both methods of analysis and the potential for imaging of these surfaces. The Chicago-Argonne resonance ionization spectrometer for microanalysis (CHARISMA) is a reflection time-of-flight mass spectrometer (TOF) that is configured for secondary ion and neutral mass spectrometry using either ... continued below

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3 p.

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Trevor, J. L.; Hanley, L.; Pellin, M. J. & Lykke, K. R. June 1996.

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TOF-SIMS has become the standard mass spectrometric tool for the molecular analysis of polymeric, organic, and biological surfaces. However, variations in desorption yields, ionization efficiencies, and ion-induced damage of adsorbates still present significant difficulties in the analysis of TOF-SIMS data. Laser desorption combined with photoionization may provide a significant improvement over TOF-SIMS. An instrument exists that has the capability of utilizing both methods of analysis and the potential for imaging of these surfaces. The Chicago-Argonne resonance ionization spectrometer for microanalysis (CHARISMA) is a reflection time-of-flight mass spectrometer (TOF) that is configured for secondary ion and neutral mass spectrometry using either ion beam bombardment or laser ablation for sample desorption. We have studied biotin and biotin conjugated self-assembled monolayers (SAMs) adsorbed onto gold as a model to compare the two processes.

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3 p.

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OSTI as DE96011907

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  • 44. American Society of Mass Spectrometry conference on mass spectrometry and allied topics, Portland, OR (United States), 12-16 May 1996

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  • Other: DE96011907
  • Report No.: ANL/CHM/CP--88956
  • Report No.: CONF-9605179--2
  • Grant Number: W-31-109-ENG-38
  • Office of Scientific & Technical Information Report Number: 242698
  • Archival Resource Key: ark:/67531/metadc666740

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  • June 1996

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  • June 29, 2015, 9:42 p.m.

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  • Nov. 19, 2015, 4:16 p.m.

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Trevor, J. L.; Hanley, L.; Pellin, M. J. & Lykke, K. R. Comparing TOF-SIMS with laser desorption/photoionization for surface analysis, article, June 1996; Illinois. (digital.library.unt.edu/ark:/67531/metadc666740/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.