Optical properties of epitaxial PLT thin films

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Metalorganic chemical vapor deposition was used to prepare epitaxial or highly oriented PLT (Pb{sub 1-x}La{sub x}TiO{sub 3}) thin films with x = 0.21-0.34. The growth of PLT films resulted in 3-D epitaxial heterostructures on a (100) surface of both MgO and KTaO{sub 3} substrates. The PLT film grown on a KTaO{sub 3} (100) substrate has a significantly lower minimum channeling yield compared to that grown on the MgO (100) substrate because of the smaller lattice mismatch associated with KTaO{sub 3}. Thickness and refractive indices at 435-1523 nm were measured by prism coupling. Measured film thickness of 570 nm was in ... continued below

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8 p.

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Kim, Y.; Erbil, A.; Boatner, L.A.; Steingart, L.; Mensah, T. & Hiamang, S. January 1, 1996.

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Metalorganic chemical vapor deposition was used to prepare epitaxial or highly oriented PLT (Pb{sub 1-x}La{sub x}TiO{sub 3}) thin films with x = 0.21-0.34. The growth of PLT films resulted in 3-D epitaxial heterostructures on a (100) surface of both MgO and KTaO{sub 3} substrates. The PLT film grown on a KTaO{sub 3} (100) substrate has a significantly lower minimum channeling yield compared to that grown on the MgO (100) substrate because of the smaller lattice mismatch associated with KTaO{sub 3}. Thickness and refractive indices at 435-1523 nm were measured by prism coupling. Measured film thickness of 570 nm was in good agreement with that obtained from RBS. Refractive index of the PLT film is smaller than that of PbTiO{sub 3}, and its difference at {lambda} = 632.8 nm is about 2.5%. Dispersion of the refractive index was well fitted by a Sellmeier dispersion formula.

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8 p.

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OSTI as DE96008693

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  • Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 27 Nov - 1 Dec 1995

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  • Other: DE96008693
  • Report No.: CONF-951155--100
  • Grant Number: AC05-96OR22464
  • Office of Scientific & Technical Information Report Number: 215784
  • Archival Resource Key: ark:/67531/metadc665813

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  • January 1, 1996

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  • June 29, 2015, 9:42 p.m.

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  • June 24, 2016, 1:23 p.m.

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Kim, Y.; Erbil, A.; Boatner, L.A.; Steingart, L.; Mensah, T. & Hiamang, S. Optical properties of epitaxial PLT thin films, article, January 1, 1996; Tennessee. (digital.library.unt.edu/ark:/67531/metadc665813/: accessed December 17, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.