Determination of the temperature dependence of the penetration depth of Nb in Nb/AlO{sub x}/Nb Josephson junctions from a resistive measurement in a magnetic field

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The temperature dependence of the penetration depth of Nb films was determined from resistive transitions of Nb/AlO{sub x}/Nb Josephson junctions in a constant magnetic field applied parallel to the junction planes. Distinct resistance peaks were observed as temperature decreases and those peaks were found to appear when the total flux threading the junction equals an integral multiple of the flux quantum. From this condition, the authors have determined the penetration depth at those peak positions. The temperature dependence was well described by the either dirty local limit or the two-fluid model. This method can be useful for highly fluctuating system ... continued below

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18 p.

Creation Information

Kim, D.H.; Gray, K.E.; Hettinger, J.D. & Kang, J.H. November 1, 1993.

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  • Kim, D.H. Korea Inst. of Science and Technology, Seoul (Korea, Republic of)
  • Gray, K.E.
  • Hettinger, J.D. Argonne National Lab., IL (United States). Materials Science Div.
  • Kang, J.H. Westinghouse Science and Technology Center, Pittsburgh, PA (United States)

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Description

The temperature dependence of the penetration depth of Nb films was determined from resistive transitions of Nb/AlO{sub x}/Nb Josephson junctions in a constant magnetic field applied parallel to the junction planes. Distinct resistance peaks were observed as temperature decreases and those peaks were found to appear when the total flux threading the junction equals an integral multiple of the flux quantum. From this condition, the authors have determined the penetration depth at those peak positions. The temperature dependence was well described by the either dirty local limit or the two-fluid model. This method can be useful for highly fluctuating system like high-temperature superconductors.

Physical Description

18 p.

Notes

INIS; OSTI as DE96006949

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  • Other Information: PBD: Nov 1993

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  • Other: DE96006949
  • Report No.: ANL/MSD/PP--81462
  • Grant Number: W-31109-ENG-38
  • DOI: 10.2172/195746 | External Link
  • Office of Scientific & Technical Information Report Number: 195746
  • Archival Resource Key: ark:/67531/metadc664034

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Creation Date

  • November 1, 1993

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  • June 29, 2015, 9:42 p.m.

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  • Aug. 23, 2016, 2:59 p.m.

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Kim, D.H.; Gray, K.E.; Hettinger, J.D. & Kang, J.H. Determination of the temperature dependence of the penetration depth of Nb in Nb/AlO{sub x}/Nb Josephson junctions from a resistive measurement in a magnetic field, report, November 1, 1993; Illinois. (digital.library.unt.edu/ark:/67531/metadc664034/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.