Relaxation Time Measurements for Collision Processes in the Surface Layers of Conductors and Semiconductors Near 10 Ghz

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Description

This thesis represents one phase of a joint effort of research on the properties of liquids and solids. This work is concerned primarily with the microwave properties of solids. In this investigation the properties exhibited by conductor and semiconductor materials when they are subjected to electromagnetic radiation of microwave frequency are studied. The method utilized in this experiment is the perturbation of a resonant cavity produced by introduction of a cylindrically shaped sample into it.

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vi, 65 leaves: ill.

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Childress, Larry Wayne December 1973.

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  • Childress, Larry Wayne

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Description

This thesis represents one phase of a joint effort of research on the properties of liquids and solids. This work is concerned primarily with the microwave properties of solids. In this investigation the properties exhibited by conductor and semiconductor materials when they are subjected to electromagnetic radiation of microwave frequency are studied. The method utilized in this experiment is the perturbation of a resonant cavity produced by introduction of a cylindrically shaped sample into it.

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vi, 65 leaves: ill.

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UNT Theses and Dissertations

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  • December 1973

Added to The UNT Digital Library

  • June 24, 2015, 9:39 a.m.

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  • Sept. 12, 2016, 2:30 p.m.

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Childress, Larry Wayne. Relaxation Time Measurements for Collision Processes in the Surface Layers of Conductors and Semiconductors Near 10 Ghz, thesis, December 1973; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc663566/: accessed July 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .