Design and performance of the 2-ID-B scanning x-ray microscope.

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We have constructed a high resolution scanning x-ray microscope at the 2-ID-B beamline at the Advanced Photon Source for 1-4 keV x-ray imaging and microspectroscopy experiments. The microscope uses a Fresnel zone plate to focus coherent x-ray undulator radiation to a 150 nm focal spot on a sample. The spectral flux in the focus is 10{sup 8} ph/s/0.1% BW. X-ray photons transmitted by the sample are detected by an avalanche photodiode as the sample is scanned to form an absorption image. The sample stage has both coarse and fine translation axes for raster scanning and a rotation axis for microtomography ... continued below

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11 p.

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McNulty, I. November 11, 1998.

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Description

We have constructed a high resolution scanning x-ray microscope at the 2-ID-B beamline at the Advanced Photon Source for 1-4 keV x-ray imaging and microspectroscopy experiments. The microscope uses a Fresnel zone plate to focus coherent x-ray undulator radiation to a 150 nm focal spot on a sample. The spectral flux in the focus is 10{sup 8} ph/s/0.1% BW. X-ray photons transmitted by the sample are detected by an avalanche photodiode as the sample is scanned to form an absorption image. The sample stage has both coarse and fine translation axes for raster scanning and a rotation axis for microtomography experiments. The incident x-ray beam energy can also be scanned via the 2-ID-B monochromator while the sample is kept in focus to record spatially resolved absorption spectra. We have measured the performance of the instrument with various test objects. The microscope hardware, software, and performance are discussed in this paper.

Physical Description

11 p.

Notes

INIS; OSTI as DE00011103

Medium: P; Size: 11 pages

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  • SPIE's 1998 Annual Meeting, San Diego, CA (US), 07/19/1998--07/24/1998

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  • Report No.: ANL/XFD/CP-97663
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 11103
  • Archival Resource Key: ark:/67531/metadc627695

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • November 11, 1998

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  • June 16, 2015, 7:43 a.m.

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  • April 6, 2017, 7:26 p.m.

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McNulty, I. Design and performance of the 2-ID-B scanning x-ray microscope., article, November 11, 1998; Illinois. (digital.library.unt.edu/ark:/67531/metadc627695/: accessed October 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.