METROLOGICAL CHALLENGES OF SYNCHROTRON RADIATION OPTICS.

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Modern third generation storage rings, require state-of-the-art grazing incidence x-ray optics, in order to monochromate the Synchrotrons Radiation (SR) source photons, and focus them into the experimental stations. Slope error tolerances in the order of 0.5 {micro}Rad RMS, and surface roughness well below 5 {angstrom} RMS, are frequently specified for mirrors and gratings exceeding 300 mm in length. Non-contact scanning instruments were developed, in order to characterize SR optical surfaces, of spherical and aspherical shape. Among these, the Long Trace Profiler (LTP), a double pencil slope measuring interferometer, has proved to be particularly reliable, and was adopted by several SR ... continued below

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7 pages

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SOSTERO,G. May 25, 1999.

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Description

Modern third generation storage rings, require state-of-the-art grazing incidence x-ray optics, in order to monochromate the Synchrotrons Radiation (SR) source photons, and focus them into the experimental stations. Slope error tolerances in the order of 0.5 {micro}Rad RMS, and surface roughness well below 5 {angstrom} RMS, are frequently specified for mirrors and gratings exceeding 300 mm in length. Non-contact scanning instruments were developed, in order to characterize SR optical surfaces, of spherical and aspherical shape. Among these, the Long Trace Profiler (LTP), a double pencil slope measuring interferometer, has proved to be particularly reliable, and was adopted by several SR optics metrology laboratories. The ELETTRA soft x-rays and optics metrology laboratory, has operated an LTP since 1992. We review the basic operating principles of this instrument, and some major instrumental and environmental improvements, that were developed in order to detect slope errors lower than 1 {micro}Rad RMS on optical surfaces up to one metre in length. A comparison among measurements made on the same reference flat, by different interferometers (most of them were LTPs) can give some helpful indications in order to optimize the quality of measurement.

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7 pages

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INIS; Refer requests to OSTI; OSTI as DE00011474

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  • EUROPTO, BERLIN (DE), 05/25/1999--05/28/1999

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  • Report No.: BNL--66662
  • Report No.: KC0204011
  • Grant Number: AC02-98CH10886
  • Office of Scientific & Technical Information Report Number: 11474
  • Archival Resource Key: ark:/67531/metadc624138

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  • May 25, 1999

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  • June 16, 2015, 7:43 a.m.

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  • Nov. 9, 2015, 1:09 p.m.

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SOSTERO,G. METROLOGICAL CHALLENGES OF SYNCHROTRON RADIATION OPTICS., article, May 25, 1999; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc624138/: accessed October 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.