X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages

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Description

High temperature XRD has been employed to monitor the devitrification of Dupont 951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835-875 C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO{sub 2} appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.

Physical Description

6 p.

Creation Information

DIMOS,DUANE B.; KOTULA,PAUL G.; RODRIGUEZ,MARK A. & YANG,PIN September 8, 1999.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 18 times . More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

High temperature XRD has been employed to monitor the devitrification of Dupont 951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835-875 C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO{sub 2} appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.

Physical Description

6 p.

Notes

OSTI as DE00013995

Medium: P; Size: 6 pages

Source

  • Denver X-Ray Conference, Steamboat Springs, CO (US), 08/02/1999--08/06/1999

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Identifier

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  • Report No.: SAND99-2324C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 13995
  • Archival Resource Key: ark:/67531/metadc623779

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Creation Date

  • September 8, 1999

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

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  • April 11, 2017, 1:27 p.m.

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DIMOS,DUANE B.; KOTULA,PAUL G.; RODRIGUEZ,MARK A. & YANG,PIN. X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages, article, September 8, 1999; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc623779/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.