Development of backscattered electron Kikuchi patterns for phase identification in the SEM

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This paper describes the use of backscattered electron Kikuchi patterns (BEKP) for phase identification in the scanning electron microscope (SEM). The origin of BEKP is described followed by a discussion of detectors capable of recording high quality patterns. In this study a new detector based on charge coupled device technology is described. Identification of unknown phases is demonstrated on prepared and as received sample surfaces. Identification through a combination of energy dispersive x-ray spectrometry (EDS) and BEKP of a Laves phase in a weld in an alloy of Fe-Co-Ni-Cr-Nb and the identification of Pb{sub 2}Ru{sub 2}O{sub 6.5} crystals on PZT ... continued below

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10 p.

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Michael, J.R. & Goehner, R.P. December 1, 1995.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

This paper describes the use of backscattered electron Kikuchi patterns (BEKP) for phase identification in the scanning electron microscope (SEM). The origin of BEKP is described followed by a discussion of detectors capable of recording high quality patterns. In this study a new detector based on charge coupled device technology is described. Identification of unknown phases is demonstrated on prepared and as received sample surfaces. Identification through a combination of energy dispersive x-ray spectrometry (EDS) and BEKP of a Laves phase in a weld in an alloy of Fe-Co-Ni-Cr-Nb and the identification of Pb{sub 2}Ru{sub 2}O{sub 6.5} crystals on PZT is demonstrated. Crystallographic phase analysis of micron sized phases in the SEM is a powerful new tool for materials characterization.

Physical Description

10 p.

Notes

OSTI as DE96002478

Source

  • 28. international Metallographic Society (IMS) conference, Albuquerque, NM (United States), 25-26 Jul 1995

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  • Other: DE96002478
  • Report No.: SAND--95-2482C
  • Report No.: CONF-9507160--3
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 161517
  • Archival Resource Key: ark:/67531/metadc622340

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  • December 1, 1995

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  • June 16, 2015, 7:43 a.m.

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  • April 13, 2016, 1:32 p.m.

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Michael, J.R. & Goehner, R.P. Development of backscattered electron Kikuchi patterns for phase identification in the SEM, article, December 1, 1995; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc622340/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.