An in situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials

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Description

A novel, in situ, high voltage electron microscopy technique for the direct observation of the micromechanisms of tensile deformation and fracture in nanostructured materials is detailed. This technique is particularly well suited for the dynamic observations of deformation and fracture in multilayered materials. The success of this type of in situ technique is highly dependent upon unique specimen preparation procedures and sample design, the importance thereof will be discussed. The initial observations discussed here are expected to aid in the understanding of the mechanical behavior of this new class of atomically engineered materials.

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6 p.

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Wall, M.A.; Barbee, T.W. Jr. & Weihs, T.P. April 14, 1995.

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Description

A novel, in situ, high voltage electron microscopy technique for the direct observation of the micromechanisms of tensile deformation and fracture in nanostructured materials is detailed. This technique is particularly well suited for the dynamic observations of deformation and fracture in multilayered materials. The success of this type of in situ technique is highly dependent upon unique specimen preparation procedures and sample design, the importance thereof will be discussed. The initial observations discussed here are expected to aid in the understanding of the mechanical behavior of this new class of atomically engineered materials.

Physical Description

6 p.

Notes

OSTI as DE96002140

Source

  • Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 17-21 Apr 1995

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  • Other: DE96002140
  • Report No.: UCRL-JC--118958
  • Report No.: CONF-950412--57
  • Grant Number: W-7405-ENG-48
  • DOI: 10.2172/132767 | External Link
  • Office of Scientific & Technical Information Report Number: 132767
  • Archival Resource Key: ark:/67531/metadc622159

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • April 14, 1995

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

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  • Feb. 16, 2016, 8:02 p.m.

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Wall, M.A.; Barbee, T.W. Jr. & Weihs, T.P. An in situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials, report, April 14, 1995; California. (digital.library.unt.edu/ark:/67531/metadc622159/: accessed December 13, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.