Detailed measurements and shaping of gate profiles for microchannel-plate-based X-ray framing cameras

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Description

Gated, microchannel-plate-based (MCP) framing cameras are increasingly used worldwide for x-ray imaging of subnanosecond laser-plasma phenomena. Large dynamic range (> 1,000) measurements of gain profiles for gated microchannel plates (MCP) are presented. Temporal profiles are reconstructed for any point on the microstrip transmission line from data acquired over many shots with variable delay. No evidence for significant pulse distortion by voltage reflections at the ends of the microstrip is observed. The measured profiles compare well to predictions by a time-dependent discrete dynode model down to the 1% level. The calculations do overestimate the contrast further into the temporal wings. The ... continued below

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8 p.

Creation Information

Landen, O.L.; Hammel, B.A.; Bell, P.M.; Abare, A. & Bradley, D.K. October 3, 1994.

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Description

Gated, microchannel-plate-based (MCP) framing cameras are increasingly used worldwide for x-ray imaging of subnanosecond laser-plasma phenomena. Large dynamic range (> 1,000) measurements of gain profiles for gated microchannel plates (MCP) are presented. Temporal profiles are reconstructed for any point on the microstrip transmission line from data acquired over many shots with variable delay. No evidence for significant pulse distortion by voltage reflections at the ends of the microstrip is observed. The measured profiles compare well to predictions by a time-dependent discrete dynode model down to the 1% level. The calculations do overestimate the contrast further into the temporal wings. The role of electron transit time dispersion in limiting the minimum achievable gate duration is then investigated by using variable duration flattop gating pulses. A minimum gate duration of 50 ps is achieved with flattop gating, consistent with a fractional transit time spread of {approx} 15%.

Physical Description

8 p.

Notes

INIS; OSTI as DE96004019

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  • Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 24-29 Jul 1994

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  • Other: DE96004019
  • Report No.: UCRL-JC--115937
  • Report No.: CONF-940723--44
  • Grant Number: W-7405-ENG-48
  • DOI: 10.2172/125097 | External Link
  • Office of Scientific & Technical Information Report Number: 125097
  • Archival Resource Key: ark:/67531/metadc620449

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • October 3, 1994

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

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  • Feb. 23, 2016, 4:06 p.m.

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Landen, O.L.; Hammel, B.A.; Bell, P.M.; Abare, A. & Bradley, D.K. Detailed measurements and shaping of gate profiles for microchannel-plate-based X-ray framing cameras, report, October 3, 1994; California. (digital.library.unt.edu/ark:/67531/metadc620449/: accessed October 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.